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Volumn 181, Issue 10, 2008, Pages 2646-2652
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A series of aluminum tungsten oxides crystallizing in a new ReO 3-related structure type
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Author keywords
Aluminum tungsten oxide; Electron diffraction; HRTEM; Shear structure; Z contrast
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Indexed keywords
ALUMINUM;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPY;
ELECTRONS;
OXIDES;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
TRANSMISSION ELECTRON MICROSCOPY;
TUNGSTEN;
ULTRATHIN FILMS;
CRYSTALLOGRAPHIC SHEARS;
HIGH-ANGLE ANNULAR DARK FIELDS;
HRTEM;
SHEAR STRUCTURE;
STACKING SEQUENCE;
STRUCTURAL MODELING;
TUNGSTEN OXIDE;
Z CONTRASTS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
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EID: 55349128502
PISSN: 00224596
EISSN: 1095726X
Source Type: Journal
DOI: 10.1016/j.jssc.2008.06.013 Document Type: Article |
Times cited : (1)
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References (27)
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