Imaging of light and heavy atomic columns by spherical aberration corrected middle-angle bright-field STEM

Ultramicroscopy

Volumn 120, Issue , 2012, Pages 48-55

  Ohtsuka, Masahiro ^a   Yamazaki, Takashi ^b   Kotaka, Yasutoshi ^b   Hashimoto, Iwao ^a   Watanabe, Kazuto ^c  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b FUJITSU LABORATORIES LTD   (Japan)

^c TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

Author keywords

Bloch wave; Bright field; STEM

Indexed keywords

ATOMIC COLUMNS; BLOCH WAVES; BLOCH-WAVE; BRIGHT SPOTS; BRIGHTFIELD; DARK SPOTS; DEFOCUS; RECIPROCAL SPACE; SAMPLE THICKNESS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULTANEOUS DETECTION; SPHERICAL ABERRATIONS; SRTIO; STEM; STEM IMAGES; WAVEFIELDS;

ABERRATIONS; O RINGS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

STRONTIUM; TITANIUM;

ABSORPTION; ARTICLE; CALCULATION; CONTROLLED STUDY; IMAGE ANALYSIS; IMAGE QUALITY; PROCESS OPTIMIZATION; SCANNING ELECTRON MICROSCOPY; SIMULATION; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84864070180     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.06.006     Document Type: Article

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