Inclusion of radiation damage dynamics in high-resolution transmission electron microscopy image simulations: The example of graphene

Physical Review B - Condensed Matter and Materials Physics

Volumn 87, Issue 9, 2013, Pages

  Santana, Adriano ^a   Zobelli, Alberto ^b   Kotakoski, Jani ^c,d   Chuvilin, Andrey ^e,f   Bichoutskaia, Elena ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c UNIVERSITY OF VIENNA   (Austria)

^d UNIVERSITY OF HELSINKI   (Finland)

^e CIC NANOGUNE   (Spain)

^f BASQUE FOUNDATION FOR SCIENCE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84875737201     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.094110     Document Type: Article

References (66)

1. C. O. Girit, J. C. Meyer, R. Erni, M. D. Rossell, C. Kisielowski, L. Yang, C.-H. Park, M. F. Crommie, M. L. Cohen, S. G. Louie, and A. Zettl, Science SCIEAS 0036-8075 10.1126/science.1166999 323, 1705 (2009).
2. J. H. Warner, M. H. Rümmeli, L. Ge, T. Gemming, B. Montanari, N. M. Harrison, B. Büchner, and G. A. D. Briggs, Nat. Nanotechnol. 10.1038/nnano.2009.194 4, 500 (2009).
3. J. C. Meyer, Ç. Ö. Girit, M. F. Crommie, and A. Zettl, Nature 10.1038/nature07094 454, 319 (2008). (Pubitemid 352009991)
4. R. Erni, M. D. Rossell, M.-T. Nguyen, S. Blankenburg, D. Passerone, P. Hartel, N. Alem, K. Erickson, W. Gannett, and A. Zettl, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.82.165443 82, 165443 (2010).
5. A. Chuvilin, U. Kaiser, E. Bichoutskaia, N. A. Besley, and A. N. Khlobystov, Nat. Chem. 10.1038/nchem.644 2, 450 (2010).
6. A. Chuvilin, J. C. Meyer, G. Algara-Siller, and U. Kaiser, New J. Phys. NJOPFM 1367-2630 10.1088/1367-2630/11/8/083019 11, 083019 (2009).
7. A. Chuvilin, E. Bichoutskaia, M. C. Gimenez-Lopez, T. W. Chamberlain, G. A. Rance, N. Kuganathan, J. Biskupek, U. Kaiser, and A. N. Khlobystov, Nat. Mater. 10.1038/nmat3082 10, 687 (2011).
8. T. W. Chamberlain, J. Biskupek, G. A. Rance, A. Chuvilin, T. J. Alexander, E. Bichoutskaia, U. Kaiser, and A. N. Khlobystov, ACS Nano 10.1021/nn300137j 6, 3943 (2012).
9. K. Kim, A. Sussman, and A. Zettl, ACS Nano 10.1021/nn901782g 4, 1362 (2010).
10. J. C. Meyer, C. Kisielowski, R. Erni, M. D. Rossell, M. F. Crommie, and A. Zettl, Nano Lett. NALEFD 1530-6992 10.1021/nl801386m 8, 3582 (2008).
11. F. Banhart, J. Kotakoski, and A. V. Krasheninnikov, ACS Nano 10.1021/nn102598m 5, 26 (2011).
12. J. A. Rodriguez-Manzo, O. Cretu, and F. Banhart, ACS Nano 10.1021/nn100356q 4, 3422 (2010).
13. T. Zoberbier, T. W. Chamberlain, J. Biskupek, N. Kuganathan, S. Eyhusen, E. Bichoutskaia, U. Kaiser, and A. N. Khlobystov, J. Am. Chem. Soc. JACSAT 0002-7863 10.1021/ja208746z 134, 3073 (2012).
14. T. W. Chamberlain, J. C. Meyer, J. Biskupek, J. Leschner, A. Santana, N. A. Besley, E. Bichoutskaia, U. Kaiser, and A. N. Khlobystov, Nat. Chem. 10.1038/nchem.1115 3, 732 (2011).
15. R. Kilaas, in Proceedings of the 45th Annual Meeting of the Microscopy Society of America, Baltimore, MD, edited by, G. W. Bailey, (San Francisco Press, San Francisco, 1987), pp. 66-67.
16. E. J. Kirkland, Advanced Computing in Electron Microscopy (Plenum, New York, 1998).
17. M. A. O'Keefe and R. Kilaas, in Image and Signal Processing in Electron Microscopy, Scanning Microscopy, Supplement 2, edited by, P. W. Hawkes, F. P. Ottensmeyer, W. O. Saxton, and, A. Rosenfeld, (Scanning Microscopy International, Chicago, 1988).
18. J. C. H. Spence and J. M. Zuo, Electron Microdiffraction (Plenum Press, New York, 1992).
19. P. A. Stadelmann, Ultramicroscopy ULTRD6 0304-3991 10.1016/0304-3991(87) 90080-5 21, 131 (1987). (Pubitemid 17558009)
20. A. Chuvilin and U. Kaiser, Ultramicroscopy ULTRD6 0304-3991 10.1016/j.ultramic.2005.03.003 104, 73 (2005). (Pubitemid 40776090)
21. M. De Graef, Introduction to Conventional Transmission Electron Microscopy (Cambridge University Press, Cambridge, UK, 2003).
22. J. M. Cowley and A. F. Moodie, Acta Crystallogr. 10.1107/ S0365110X57002194 10, 609 (1957).
23. P. Goodman and A. F. Moodie, Acta Crystallogr., Sect. A 10.1107/S056773947400057X 30, 280 (1974).
24. K. Fujiwara, J. Phys. Soc. Jpn. 10.1143/JPSJ.14.1513 14, 1513 (1959).
25. L. Sturkey, Proc. Phys. Soc. 10.1088/0370-1328/80/2/301 80, 321 (1962).
26. F. Fujimoto, J. Phys. Soc. Jpn. 10.1143/JPSJ.14.1558 14, 1558 (1959).
27. B. K. Jap and R. M. Glaeser, Acta Crystallogr., Sect. A 10.1107/S0567739478000170 34, 94 (1978).
28. J. E. Evans, C. Hetherington, A. Kirkland, L.-Y. Chang, H. Stahlberg, and N. Browning, Ultramicroscopy ULTRD6 0304-3991 10.1016/j.ultramic.2008.06.004 108, 1636 (2008).
29. K. Mitsuoka, Micron MICNB2 0047-7206 10.1016/j.micron.2010.08.006 42, 100 (2011).
30. A. V. Krasheninnikov and K. Nordlund, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.3318261 107, 071301 (2010).
31. H. H. Rose, Philos. Trans. R. Soc., A 10.1098/rsta.2009.0062 367, 3809 (2009).
32. R. F. Egerton, R. McLeod, F. Wang, and M. Malac, Ultramicroscopy ULTRD6 0304-3991 10.1016/j.ultramic.2009.11.003 110, 991 (2010).
33. L. Reimer and H. Kohl, in Transmission Electron Microscopy: Physics of Image Formation, Springer Series in Optical Sciences, Vol. 36 (Springer, Berlin, 2008), Chap. 11.
34. R. F. Egerton, P. Li, and M. Malac, Micron MICNB2 0047-7206 10.1016/j.micron.2004.02.003 35, 399 (2004). (Pubitemid 38583516)
35. B. W. Smith and D. E. Luzzi, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1383020 90, 3509 (2001).
36. D. T. Gillespie, J. Phys. Chem. JPCHAX 0022-3654 10.1021/j100540a008 81, 2340 (1977).
37. M. A. Gibson and J. Bruck, J. Phys. Chem. A JPCAFH 1089-5639 10.1021/jp993732q 104, 1876 (2000).
38. J. C. Meyer, F. Eder, S. Kurasch, V. Skakalova, J. Kotakoski, H. J. Park, S. Roth, A. Chuvilin, S. Eyhusen, G. Benner, A. V. Krasheninnikov, and U. Kaiser, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.108.196102 108, 196102 (2012).
39. T. Frauenheim, G. Seifert, M. Elstner, T. Niehaus, C. Köhler, M. Amkreutz, M. Sternberg, Z. Hajnal, A. Di Carlo, and S. Suhai, J. Phys.: Condens. Matter 10.1088/0953-8984/14/11/313 14, 3015 (2002). (Pubitemid 34288370)
40. A. Zobelli, A. Gloter, C. P. Ewels, G. Seifert, and C. Colliex, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.75.245402 75, 245402 (2007).
41. J. Kotakoski, J. C. Meyer, S. Kurasch, D. Santos-Cottin, U. Kaiser, and A. V. Krasheninnikov, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.83.245420 83, 245420 (2011).
42. J. Kotakoski, D. Santos-Cottin, and A. V. Krasheninnikov, ACS Nano 10.1021/nn204148h 6, 671 (2012).
43. W. A. McKinley, Jr. and H. Feshbach, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.74.1759 74, 1759 (1948).
44. T. Iwata and T. Nihira, J. Phys. Soc. Jpn. JUPSAU 0031-9015 10.1143/JPSJ.31.1761 31, 1761 (1971).
45. Y. Shao, Phys. Chem. Chem. Phys. PPCPFQ 1463-9076 10.1039/b517914a 8, 3172 (2006).
46. J. D. Gale and A. L. Rohl, Mol. Simul. MOSIEA 0892-7022 10.1080/0892702031000104887 29, 291 (2003). (Pubitemid 44115103)
47. D. W. Brenner, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.42.9458 42, 9458 (1990).
48. Z. L. Wang, Elastic and Inelastic Scattering in Electron Diffraction and Imaging (Plenum Press, New York, 1995).
49. A. Lubk, F. Röder, T. Niermann, C. Gatel, S. Joulie, F. Houdellier, C. Magén, and M. J. Hÿtch, Ultramicroscopy ULTRD6 0304-3991 10.1016/j.ultramic.2012.01.011 115, 78 (2012).
50. F. Banhart, Rep. Prog. Phys. RPPHAG 0034-4885 10.1088/0034-4885/62/8/201 62, 1181 (1999).
51. G. Zheng, S. Irle, and K. Morokuma, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.1825375 122, 014708 (2005). (Pubitemid 41047795)
52. S. Irle, G. Zheng, Z. Wang, and K. Morokuma, J. Phys. Chem. B JPCBFK 1520-6106 10.1021/jp061173z 110, 14531 (2006). (Pubitemid 44325026)
53. G. Zheng, Z. Wang, S. Irle, and K. Morokuma, J. Nanosci. Nanotechnol. 10.1166/jnn.2007.451 7, 1662 (2007).
54. J. Y. Huang, F. Ding, K. Jiao, and B. I. Yakobson, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.99.175503 99, 175503 (2007). (Pubitemid 350015161)
55. A. J. Stone and D. J. Wales, Chem. Phys. Lett. CHPLBC 0009-2614 10.1016/0009-2614(86)80661-3 128, 501 (1986).
56. R. L. Murry, D. L. Strout, and G. E. Scuseria, J. Mass Spectrom. Ion Processes 10.1016/0168-1176(94)04037-0 138, 113 (1994).
57. R. M. Glaeser, J. Ultrastruct. Res. JULRA7 0022-5320 10.1016/S0022- 5320(71)80118-1 36, 466 (1971).
58. A. Boudet and L. P. Kubin, Ultramicroscopy ULTRD6 0304-3991 10.1016/0304-3991(82)90064-X 8, 409 (1982).
59. M. Malac, M. Beleggia, R. Egerton, and Y. Zhu, Ultramicroscopy ULTRD6 0304-3991 10.1016/j.ultramic.2006.05.001 107, 40 (2007). (Pubitemid 44792869)
60. A. Rose, J. Opt. Soc. Am. JOSAAH 0030-3941 10.1364/JOSA.38.000196 38, 196 (1948).
61. M. Lentzen, B. Jahnen, C. L. Jia, A. Thust, K. Tillmann, and K. Urban, Ultramicroscopy ULTRD6 0304-3991 10.1016/S0304-3991(02)00139-0 92, 233 (2002). (Pubitemid 34721350)
62. N. A. Allsop, P. J. Dobson, and J. L. Hutchison, J. Microsc. JMICAR 0022-2720 10.1111/j.1365-2818.2006.01591.x 223, 1 (2006). (Pubitemid 44035799)
63. K. W. Urban, C. L. Jia, L. Houben, M. Lentzen, S. B. Mi, and K. Tillmann, Philos. Trans. R. Soc. A 10.1098/rsta.2009.0134 367, 3735 (2009).
64. O. J. Scherzer, Z. Phys. ZEPYAA 0044-3328 10.1007/BF01349606 101, 593 (1936).
65. See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.87.094110 for video of imaging conditions.
66. A. Thust, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.102. 220801 102, 220801 (2009).