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Volumn 223, Issue 1, 2006, Pages 1-8

Optimized HREM imaging of objects supported by amorphous substrates using spherical aberration adjustment

Author keywords

Amorphous carbon; Multislice modelling; Signal to noise; Spherical aberration; Substrate contrast; Weak phase object

Indexed keywords

ABERRATIONS; AMORPHOUS CARBON; ASPHERICS; HIGH RESOLUTION ELECTRON MICROSCOPY; SIGNAL TO NOISE RATIO; SPHERES;

EID: 33745850454     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01591.x     Document Type: Article
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.