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Volumn 223, Issue 1, 2006, Pages 1-8
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Optimized HREM imaging of objects supported by amorphous substrates using spherical aberration adjustment
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Author keywords
Amorphous carbon; Multislice modelling; Signal to noise; Spherical aberration; Substrate contrast; Weak phase object
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Indexed keywords
ABERRATIONS;
AMORPHOUS CARBON;
ASPHERICS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
SIGNAL TO NOISE RATIO;
SPHERES;
ABERRATION CORRECTORS;
AMORPHOUS SUBSTRATE;
MICROSCOPY IMAGING;
MULTI-SLICE MODEL;
PERFORMANCE;
SIGNAL TO NOISE;
SPHERICAL ABERRATIONS;
STEP CHANGES;
SUBSTRATE CONTRAST;
WEAK PHASE OBJECT;
SUBSTRATES;
CARBON;
ARTICLE;
CONTRAST;
ELECTRON MICROSCOPY;
HIGH RESOLUTION ELECTRON MICROSCOPY;
IMAGING;
MODEL;
PRIORITY JOURNAL;
SIGNAL NOISE RATIO;
TECHNIQUE;
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EID: 33745850454
PISSN: 00222720
EISSN: 13652818
Source Type: Journal
DOI: 10.1111/j.1365-2818.2006.01591.x Document Type: Article |
Times cited : (3)
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References (12)
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