Interactions and reactions of transition metal clusters with the interior of single-walled carbon nanotubes imaged at the atomic scale

Journal of the American Chemical Society

Volumn 134, Issue 6, 2012, Pages 3073-3079

  Zoberbier, Thilo ^a   Chamberlain, Thomas W ^b   Biskupek, Johannes ^a   Kuganathan, Navaratnarajah ^b   Eyhusen, Soeren ^c   Bichoutskaia, Elena ^b   Kaiser, Ute ^a   Khlobystov, Andrei N ^b  

^a UNIVERSITY OF ULM   (Germany)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^c CARL ZEISS SMT AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LEVELS; ATOMIC SCALE; BONDING ENERGIES; DEFECT FORMATION; ELECTRON ENERGIES; ELECTRONIC DENSITY; FIRST-PRINCIPLES DENSITY FUNCTIONAL THEORY; LOCALIZED DEFECTS; LOW-VOLTAGE; METAL CLUSTER; STRUCTURAL TRANSFORMATION; TRANSITION-METAL CLUSTERS; TUBULAR STRUCTURES;

CALCULATIONS; DEFECTS; ELECTRON BEAMS; NANOTUBES; OSMIUM; TRANSITION METALS; TRANSMISSION ELECTRON MICROSCOPY; TUBULAR STEEL STRUCTURES; TUNGSTEN;

RHENIUM;

CARBON NANOTUBE; METAL COMPLEX; OSMIUM; RHENIUM; SINGLE WALLED NANOTUBE; TRANSITION ELEMENT; TUNGSTEN;

ARTICLE; DENSITY FUNCTIONAL THEORY; ELECTRON BEAM; ENCAPSULATION; ENERGY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOTECHNOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84856901666     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja208746z     Document Type: Article

References (39)

1. Tian, W. Q.; Liu, L. V.; Yang, Y. A. Phys. Chem. Chem. Phys. 2006, 8, 3528-3539
2. Kong, K.; Choi, Y.; Ryu, B.; Lee, J.; Chang, H. Mater. Sci. Eng., C 2006, 26, 1207-1210
3. Pan, X.; Bao, X. Chem. Commun. 2008, 6271-6281
4. Castillejos, E.; Debouttiere, P. J.; Roiban, L.; Solhy, A.; Martinez, V.; Kihn, Y.; Ersen, O.; Philippot, K.; Chaudret, B.; Serp, P. Angew. Chem., Int. Ed. 2009, 48, 2529-2533
5. Yildrim, T.; Ciraci, S. Phys. Rev. Lett. 2005, 94, 175501
6. Dong, X.; Lau, C. M.; Lohani, A.; Mhaisalkar, S. G.; Kasim, J.; Shen, Z. X.; Ho, X.; Rogers, J. A.; Li, L.-J. Adv. Mater. 2008, 20, 2389-2392
7. Nemec, N.; Tomanek, D.; Cuniberti, G. Phys. Rev. Lett. 2006, 96, 076802
8. Palacios, J. J.; Perez-Jimenez, A. J.; Louis, E.; SanFabian, E.; Verges, J. A. Phys. Rev. Lett. 2003, 90, 106801
9. Yang, C. K.; Zhao, J.; Lu, J. P. Nano Lett. 2004, 4, 561-563
10. Rodrigues-Manzo, J. A.; Banhart, F.; Terrones, M.; Terrones, H.; Grobert, N.; Ajayan, P. M.; Sumpter, B. G.; Meunier, V.; Wang, M.; Bando, Y.; Goldberg, D. Proc. Natl. Acad. Sci. U.S.A. 2009, 106, 4591-4595
11. Yang, S. H.; Shin, W. H.; Lee, J. W.; Kim, S. Y.; Woo, S. I.; Kang, J. K. J. Phys. Chem. B 2006, 110, 13941-13946
12. Zhuang, H. L.; Zheng, G. P.; Soh, A. K. Comput. Mater. Sci. 2008, 43, 823-828
13. Valencia, H.; Gil, A.; Frapper, G. J. Phys. Chem. C 2010, 114, 14141-14153
14. Inntam, C.; Limtrakul, J. J. Phys. Chem. C 2010, 114, 21327-21337
15. Chen, Y. K.; Liu, L. V.; Tian, W. Q.; Wang, Y. A. J. Phys. Chem. C 2011, 115, 9306-9311
16. Nakamura, E.; Koshino, M.; Saito, T.; Niimi, Y.; Suenaga, K.; Matsuo, Y. J. Am. Chem. Soc. 2011, 133, 14151-14153
17. Koshino, M.; Tanaka, T.; Solin, N.; Suenaga, K.; Isobe, H.; Nakamura, E. Science 2007, 316, 853
18. Koshino, M.; Niimi, Y.; Nakamura, E.; Kataura, H.; Okazaki, T.; Suenaga, K; Iijima, S. Nat. Chem. 2010, 2, 117-124
19. Chuvilin, A.; Bichoutskaia, E.; Gimenez-Lopez, M. C.; Chamberlain, T. W.; Rance, G. A.; Kuganathan, N.; Biskupek, J.; Kaiser, U.; Khlobystov, A. N. Nat. Mater. 2011, 10, 687-692
20. Chamberlain, T. W.; Meyer, J. C.; Biskupek, J.; Leschner, J.; Santana, A.; Besley, N. A.; Bichoutskaia, E.; Kaiser, U; Khlobystov, A. N. Nat. Chem. 2011, 3, 732-737
21. Chuvilin, A.; Kaiser, U.; Bichoutskaia, E.; Besley, N. A.; Khlobystov, A. N. Nat. Chem. 2010, 2, 450-453
22. Tasis, D.; Tagmatarchis, N.; Bianco, A.; Prato, M. Chem. Rev. 2006, 106, 1105-1136
23. Williams, D. B.; Carter, C. B. Transmission Electron Microscopy: A Textbook for Materials Science, 2 nd ed.; Springer: New York, 2009.
24. McKinsley, W.; Feshbach, H. Phys. Rev. 1948, 74, 1759
25. Smith, B. W.; Luzzi, D. E. J. Appl. Phys. 2001, 90, 3509-3515
26. Zobelli, A.; Gloter, A.; Ewels, C. P.; Seifert, G.; Colliex, C. Phys. Rev. B 2007, 75, 245402
27. CRC Handbook of Chemistry and Physics, 86 th ed.; Lide, D. R., Ed.; CRC Press: Boca Raton, FL, 2005.
28. Muetterties, E. L.; Bleeke, J. R.; Wucherer, J.; Albright, T. A. Chem. Rev. 1982, 82, 499-525
29. Ding, F.; Harman, W. D. J. Am. Chem. Soc. 2004, 126, 13752-13756
30. Krasheninnikov, A. V.; Lehtinen, P. O.; Foster, A. S.; Pyykko, P.; Nieminen, R. M. Phys. Rev. Lett. 2009, 102, 126807
31. Gan, Y.; Sun, L.; Banhart, F. Small 2008, 4, 587-591
32. Chan, K. T.; Neaton, J. B.; Cohen, M. L. Phys. Rev. B 2008, 77, 235430
33. Anton, R.; Schneidereit, I. Phys. Rev. B 1998, 58, 13874-13881
34. Rodriguez-Manzo, J. A.; Cretu, O.; Banhart, F. ACS Nano 2010, 4, 3422-3428
35. Meyer, J. C.; Kurasch, S.; Park, H. J.; Skakalova, V.; Kunzel, D.; Gross, A.; Chuvilin, A.; Algara-Siller, G.; Roth, S.; Iwasaki, T.; Starke, U.; Smet, J. H.; Kaiser, U. Nat. Mater. 2011, 10, 209-215
36. Meyer, J. C.; Chuvilin, A.; Algara-Siller, G.; Biskupek, J.; Kaiser, U. Nano Lett. 2009, 9, 2683-2689
37. Kaiser, U.; Biskupek, J.; Meyer, J. C.; Leschner, J.; Lechner, L.; Rose, H.; Stöger-Pollach, M.; Khlobystov, A. N.; Hartel, P.; Müller, H.; Haider, M.; Eyhusen, S.; Benner, G. Ultramicroscopy 2011, 111, 1239-1246
38. Payne, M. C.; Teter, M. P.; Allan, D. C.; Arias, T. A.; Joannopoulos, J. D. Rev. Mod. Phys. 1992, 64, 1045-1097
39. Perdew, J. P.; Burke, K.; Ernzerhof, M. Phys. Rev. Lett. 1996, 77, 3865-3868