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Volumn 4, Issue 6, 2010, Pages 3422-3428

Trapping of metal atoms in vacancies of carbon nanotubes and graphene

Author keywords

Carbon nanotubes; Graphene; In situ electron microscopy; Lattice defects; Nanostructuring

Indexed keywords

ATOMIC PRECISION; DE-TRAPPING; FOREIGN ATOMS; GRAPHENE LAYERS; GRAPHENES; IN-SITU ELECTRON MICROSCOPY; LATTICE DEFECTS; METAL ATOMS; NANO-STRUCTURING; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SINGLE METAL ATOMS; TEMPERATURE RANGE; TRAPPING CENTERS;

EID: 77955854646     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn100356q     Document Type: Article
Times cited : (266)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.