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Volumn 556, Issue , 2013, Pages 62-66

Ti/Ni/Ti/Au Ohmic contact and Schottky transformation to Al-doped ZnO thin films

Author keywords

Annealing; Interface diffusion; Ohmic contact; Schottky transformation; Specific contact resistivity

Indexed keywords

AL-DOPED ZNO THIN FILMS; ANNEALING TEMPERATURES; ANNEALING TREATMENTS; CONTACT RESISTIVITIES; I - V CURVE; INTERFACE DIFFUSION; METALLIC CONTACTS; MULTI-LAYERED; SCHOTTKY; SPECIFIC CONTACT RESISTIVITY;

EID: 84872395857     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2012.12.104     Document Type: Article
Times cited : (10)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.