Statistical equivalency and optimality of simple step-stress accelerated test plans for the exponential distribution

Naval Research Logistics

Volumn 60, Issue 1, 2013, Pages 19-30

  Hu, Cheng Hung ^a   Plante, Robert D ^b   Tang, Jen ^b  

^a YUAN ZE UNIVERSITY   (Taiwan)

^b PURDUE UNIVERSITY   (United States)

Author keywords

accelerated life test; equivalent accelerated life testing plan; optimum accelerated life testing plan; step stress accelerated life testing

Indexed keywords

ACCELERATED LIFE TESTING; ACCELERATED LIFE TESTS; ACCELERATED TEST PLANS; EXPONENTIAL DISTRIBUTIONS; FORMAL PROOFS; MODEL ASSUMPTIONS; OPTIMALITY; RELIABILITY INFORMATION; STEP-STRESS; STRESS LEVELS; STRESS LOADING; TEST UNIT;

OPTIMIZATION; STRESS ANALYSIS; TESTING;

LOADING;

EID: 84872354914     PISSN: 0894069X     EISSN: 15206750     Source Type: Journal    
DOI: 10.1002/nav.21516     Document Type: Article

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