SCOPUS 정보 검색 플랫폼

Volumn 139, Issue 5, 2009, Pages 1799-1808

Optimal simple step stress accelerated life test design for reliability prediction

Author keywords

Censoring; Failure data; Hold time; Reliability; Step stress accelerated life testing; Weibull

Indexed keywords

EID: 59649115224 PISSN: 03783758 EISSN: None Source Type: Journal
DOI: 10.1016/j.jspi.2008.05.046 Document Type: Article

Times cited : (77)

References (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.