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Volumn 45, Issue 2, 1996, Pages 341-345

Optimum 3-step step-stress tests

Author keywords

Accelerated life test; Compound linear plan; Maximum likelihood; Step stress test

Indexed keywords

FAILURE (MECHANICAL); MATHEMATICAL MODELS; OPTIMIZATION; PARAMETER ESTIMATION; PROBABILITY; RELIABILITY; SERVICE LIFE; STRESSES;

EID: 0030172155     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.510823     Document Type: Article
Times cited : (96)

References (8)
  • 3
    • 0021427118 scopus 로고    scopus 로고
    • "A comparison of accelerated life test plans for Weibull and lognormal distributions and type i censoring"
    • 26, 1984 May, pp 157-171.
    • W.Q. Meeker, "A comparison of accelerated life test plans for Weibull and lognormal distributions and type I censoring", Technometrics, vol 26, 1984 May, pp 157-171.
    • Technometrics, Vol
    • Meeker, W.Q.1
  • 6
    • 0019026625 scopus 로고    scopus 로고
    • "Accelerated life testing step-stress models and data analysis"
    • 1980 Jun, pp 103-108.
    • W. Nelson, "Accelerated life testing step-stress models and data analysis", IEEE Trans. Reliability, vol R-29, 1980 Jun, pp 103-108.
    • IEEE Trans. Reliability, Vol R-29
    • Nelson, W.1
  • 8
    • 0001008029 scopus 로고    scopus 로고
    • "An efficient method for finding the minimum of a function of several variables without calculating derivatives"
    • 7, 1964 Jul, pp 155-62.
    • M.J. Powell, "An efficient method for finding the minimum of a function of several variables without calculating derivatives", The Computer J., vol 7, 1964 Jul, pp 155-62.
    • The Computer J., Vol
    • Powell, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.