Optimal simple step-stress plan for Khamis-Higgins model

IEEE Transactions on Reliability

Volumn 51, Issue 2, 2002, Pages 212-215

  Alhadeed, Abdulla A ^a   Yang, Shie Shien ^b  

^a UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

^b KANSAS STATE UNIVERSITY   (United States)

Author keywords

Accelerated test; Maximum likelihood estimation; Step stress; Weibull life distribution

Indexed keywords

APPROXIMATION THEORY; LIFE CYCLE; MAXIMUM LIKELIHOOD ESTIMATION; STRESS ANALYSIS; WEIBULL DISTRIBUTION;

ACCELERATED LIFE TESTING;

PRODUCT DEVELOPMENT;

EID: 0036599712     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2002.1011527     Document Type: Article

References (9)

1. Optimum simple step-stress accelerated life tests with censoring
2. Comparison between constant and step-stress tests for Weibull models
3. Optimum 3-step step-stress tests
4. A new model for step-stress testing
5. Optimum censored accelerated life test for normal and lognormal life distribution
6. A comparison of accelerated life test plans for Weibull and lognormal distributions and type I censoring
7. Optimum simple step-stress plans for accelerated life testing
8. Accelerated life testing step-stress models and data analysis
9. Theory for optimum censored life tests for Weibull and extreme value distribution