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Volumn 26, Issue 4, 1997, Pages 1301-1313

Optimum M-step, step-stress design with K stress variables

Author keywords

Accelerated life test; Exponential distribution; Step stress

Indexed keywords

CAPACITORS; MATHEMATICAL MODELS; POLYNOMIALS; REGRESSION ANALYSIS;

EID: 0031272648     PISSN: 03610918     EISSN: None     Source Type: Journal    
DOI: 10.1080/03610919708813441     Document Type: Article
Times cited : (40)

References (8)
  • 1
    • 0024891878 scopus 로고
    • Optimum simple step-stress accelerated life tests with censoring
    • Bai, D. S., Kim M.S., and Lee S.H. (1989). Optimum simple step-stress accelerated life tests with censoring. IEEE Trans. Reliability. 38, 5528-532.
    • (1989) IEEE Trans. Reliability , vol.38 , pp. 5528-5532
    • Bai, D.S.1    Kim, M.S.2    Lee, S.H.3
  • 3
    • 85033155488 scopus 로고
    • Ph.D. Dissertation. Department of Statistics, Kansas State University, Kansas, June
    • Khamis, I.H., Multiple step-stress accelerated life testing. Ph.D. Dissertation. Department of Statistics, Kansas State University, Kansas, June 1995.
    • (1995) Multiple Step-stress Accelerated Life Testing
    • Khamis, I.H.1
  • 4
    • 0005620479 scopus 로고    scopus 로고
    • Comparison between constant and step-stress tests for Weibull models
    • Khamis, I.H., (1997). Comparison between constant and step-stress tests for Weibull models. International Journal of Quality & Reliability Management, Vol. 14, No. 1, 74-81.
    • (1997) International Journal of Quality & Reliability Management , vol.14 , Issue.1 , pp. 74-81
    • Khamis, I.H.1
  • 6
    • 0020734526 scopus 로고
    • Optimum simple step-stress plans for accelerated life testing
    • Miller, R., and Nelson, W. B. (1983). Optimum simple step-stress plans for accelerated life testing. IEEE Trans. Reliability. R-32, 59-65.
    • (1983) IEEE Trans. Reliability , vol.R-32 , pp. 59-65
    • Miller, R.1    Nelson, W.B.2
  • 7
    • 0019026625 scopus 로고
    • Accelerated life testing step-stress models and data analysis
    • Nelson, W.B. (1980). Accelerated life testing step-stress models and data analysis. IEEE Trans. Reliability. R-29, 103-108.
    • (1980) IEEE Trans. Reliability , vol.R-29 , pp. 103-108
    • Nelson, W.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.