메뉴 건너뛰기




Volumn 47, Issue 2, 1998, Pages 142-146

Inferences on a simple step-stress model with type-II censored exponential data

Author keywords

Accelerated life testing; Confidence interval; Exponential distribution; Maximum likelihood; Pivotal quantity; Step stress; Type II censoring

Indexed keywords

LIFE CYCLE; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PARAMETER ESTIMATION; STRESS ANALYSIS;

EID: 0032083911     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.722278     Document Type: Article
Times cited : (101)

References (8)
  • 1
    • 0024891878 scopus 로고    scopus 로고
    • "Optimum simple step-stress accelerated life tests with censoring''
    • vol 38, 1989 Dec, pp
    • D.S. Bai, M.S. Kim, S.H. Lee, "Optimum simple step-stress accelerated life tests with censoring'', IEEE Trans. Reliability, vol 38, 1989 Dec, pp 528-532.
    • IEEE Trans. Reliability , pp. 528-532
    • Bai, D.S.1    Kim, M.S.2    Lee, S.H.3
  • 2
    • 0000714520 scopus 로고    scopus 로고
    • P.K. Goel, "Bayesian estimation and optimal designs in partially accelerated life testing"
    • vol 26, 1979, pp
    • M.H. DcGroot, P.K. Goel, "Bayesian estimation and optimal designs in partially accelerated life testing", Naval Research Logistics Quarterly, vol 26, 1979, pp 223-235.
    • Naval Research Logistics Quarterly , pp. 223-235
    • Dcgroot, M.H.1
  • 4
    • 0020734526 scopus 로고    scopus 로고
    • W.B. Nelson, "Optimum simple step-stress plans for accelerated life testing"
    • vol R-32, 1983 Apr, pp
    • R. Miller, W.B. Nelson, "Optimum simple step-stress plans for accelerated life testing", IEEE Trans. Reliability, vol R-32, 1983 Apr, pp 59-65.
    • IEEE Trans. Reliability , pp. 59-65
    • Miller, R.1
  • 5
    • 0019026625 scopus 로고    scopus 로고
    • "Accelerated life testing - Step-stress models and data analysis"
    • vol R-29, 1980 Jun, pp
    • W.B. Nelson, "Accelerated life testing - Step-stress models and data analysis", IEEE Trans. Reliability, vol R-29, 1980 Jun, pp 103-108.
    • IEEE Trans. Reliability , pp. 103-108
    • Nelson, W.B.1
  • 7
    • 0001336188 scopus 로고    scopus 로고
    • N.D. Singpurwalla, "Inference for step-stress accelerated life tests"
    • vol 7, 1983, pp
    • M. Shaked, N.D. Singpurwalla, "Inference for step-stress accelerated life tests", J. Statistical Planning and Inference, vol 7, 1983, pp 295-306.
    • J. Statistical Planning and Inference , pp. 295-306
    • Shaked, M.1
  • 8
    • 0023331397 scopus 로고    scopus 로고
    • B.Z. Sheng, "Some aspects of accelerated life testing by progressive stress"
    • 36, 1987 Apr, pp
    • X.K. Yin, B.Z. Sheng, "Some aspects of accelerated life testing by progressive stress", IEEE Trans. Reliability, vol R-36, 1987 Apr, pp 150-155.
    • IEEE Trans. Reliability, Vol R , pp. 150-155
    • Yin, X.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.