Step-stress life-testing with random stress-change times for exponential data

IEEE Transactions on Reliability

Volumn 48, Issue 2, 1999, Pages 141-148

  Xiong, Chengjie ^a   Milliken, George A ^b  

^a SOUTHEAST MISSOURI STATE UNIVERSITY   (United States)

^b KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

STEP-STRESS ACCELERATED LIFE-TESTING;

MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; RANDOM PROCESSES; STRESS ANALYSIS;

STATISTICAL TESTS;

EID: 0032684450     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.784272     Document Type: Article

References (16)

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