A general accelerated life model for step-stress testing

IIE Transactions (Institute of Industrial Engineers)

Volumn 37, Issue 11, 2005, Pages 1059-1069

  Zhao, Wenbiao ^a,c   Elsayed, Elsayed A ^b,d,e  

^a RELIASOFT CORPORATION   (United States)

^b DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

^c IEEE   (United States)

^d RUTGERS UNIVERSITY   (United States)

^e ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIKELIHOOD FUNCTION DIUSTRIBUTIONS; LONGNORMAL DISTRIBUTIONS;

ALGORITHMS; FUNCTIONS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; STATISTICAL METHODS;

STRESS ANALYSIS;

EID: 29144527649     PISSN: 0740817X     EISSN: None     Source Type: Journal    
DOI: 10.1080/07408170500232396     Document Type: Article

References (26)

1. Bai, D.S. and Chun, Y.R. (1991) Optimum simple step-stress accelerated life tests with competing causes of failure. IEEE Transactions on Reliability, 40, 622-627.
2. Bai, D.S., Kim, M.S. and Lee, S.H. (1989) Optimum simple step-stress accelerated life tests with censoring. IEEE Transaction on Reliability, 38, 528-532.
3. Bhattacharyya, G.K. (1986) Parametric models and inference procedures for accelerated life tests, presented as an invited paper for 46th session of the International Statistical Institute Meeting, Tokyo, Japan, 8-16 September 1986.
4. Bhattacharyya, G.K. and Soejoeti, Z. (1989) A tampered failure rate model for step-stress accelerated life test. Communications in Statistics.- Theory and Methods, 18, 1627-1643.
5. Chung, S.W. and Bai, D.S. (1998) Optimal designs of simple step-stress accelerated life tests for lognormal lifetime distributions. International Journal of Reliability, Quality and Safety Engineering, 5, 315-336.
6. Cox, D.R. (1972) Regression models and life tables (with discussion). Journal of the Royal Statistical Society, Series B, 34, 187-208.
7. DeGroot, M.H. and Goel, P.K. (1979) Bayesian estimation and optimal designs in partially accelerated life testing. Naval Research Logistics Quarterly, 26, 223-235.
8. Doksum, K.A. and Hoyland, A. (1991) Models for variable-stress accelerated life testing experiments based on Wiener process and inverse Gaussian distribution. Technometrics, 34, 74-82.
9. Fukuda, M. (1988) Laser and LED reliability update. Journal of Lightwave Technology, 6, 1488-1495.
10. Fukuda, M., Wakita, K. and Iwane, G. (1983) Dark defects in In-GaAsP/InP double heterostructure lasers under accelerated aging. Journal of Applied Physics, 54, 1246-1250.
11. Gouno, E. (2001) An inference method for temperature step-stress accelerated life testing. Quality and Reliability Engineering International, 17, 11-18.
12. Khamis, I.H. and Higgins, J.J. (1996) Optimum 3-step step-stress tests. IEEE Transactions on Reliability, 45, 341-345.
13. Khamis, I.H. and Higgins, J.J. (1998) New model for step-stress testing. IEEE Transactions on Reliability, 47(2), 131-134.
14. Lu, Y. and Storer, B. (2001), A tampered Brownian motion process model for partial step-stress accelerated life testing. Journal of Statistical Planning and Inference, 94, 15-24.
15. Meeker, W.Q. and Escobar, A.L. (1998) Statistical Methods for Reliability Data, Wiley, New York.
16. Miller, R. and Nelson, WB. (1983) Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability, 32, 59-65.
17. Nelson, W. (1980) Accelerated life testing-step-stress models and data analysis. IEEE Transactions on Reliability, 29(2), 103-108.
18. Nelson, W.B. (1990) Accelerated Testing-Statistical Models, Test Plans, and Data Analyses, Wiley, New York.
19. Pan, R. and Ayala, S. (2003) Two statistical models for step-stress accelerated life test analysis, presented at the Fall Technical Conference of ASQ and ASA, El Paso, TX.
20. Schmoyer, R.L. (1991) Nonparametric analysis for two-level single-stress accelerated life tests. Technometries, 33, 175-186.
21. Snaked, M. and Singpurwalla, N.D. (1983) Inference for step-stress accelerated life tests. Journal of Statistical Planning and Inference, 7, 295-306.
22. Tang, L.C., Sun, Y.S., Goh, T.N. and Ong, H.L. (1996) Analysis of stepstress accelerated-life-test data: A new approach. IEEE Transactions on Reliability, 45(1), 69-74.
23. Xiong, C. (1998) Inferences on a simple step-stress model with type-II censored exponential data. IEEE Transactions on Reliability, 47, (2), 142-146.
24. Xiong, C. and Milliken, G.A. (1999) Step-stress life-testing with random stress-change times for exponential data. IEEE Transactions on Reliability, 48(2), 141-148.
25. Xiong, C. and Milliken, G.A. (2002) Prediction for exponential life-times based on step-stress testing. Communications in Statistics-Simulation, 31(4), 539-556.
26. Yin, X. and Sheng, B. (1987) Some aspects of accelerated life testing by progressive stress. IEEE Transactions on Reliability, 36(1), 150-155.