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Volumn 61, Issue 1, 2009, Pages 251-274

Exact inference for a simple step-stress model from the exponential distribution under time constraint

Author keywords

Accelerated testing; Bootstrap method; Conditional moment generating function; Coverage probability; Cumulative exposure model; Exponential distribution; Maximum likelihood estimation; Order statistics; Step stress models; Tail probability; Type I censoring

Indexed keywords

BLOCK CODES; DISTRIBUTION FUNCTIONS; EXPERIMENTS; FUNCTION EVALUATION; FUNCTIONS; IMAGE SEGMENTATION; LOAD TESTING; MAXIMUM LIKELIHOOD; METHOD OF MOMENTS; MONTE CARLO METHODS; PROBABILITY; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; STRESS ANALYSIS; TURBO CODES;

EID: 59849124532     PISSN: 00203157     EISSN: 15729052     Source Type: Journal    
DOI: 10.1007/s10463-007-0135-3     Document Type: Article
Times cited : (50)

References (26)
  • 2
    • 0000032124 scopus 로고
    • Testing the hypothesis of additive accumulation of damages
    • V. Bagdonavicius 1978 Testing the hypothesis of additive accumulation of damages Probability Theory and its Application 23 403 408
    • (1978) Probability Theory and Its Application , vol.23 , pp. 403-408
    • Bagdonavicius, V.1
  • 4
    • 33847735552 scopus 로고    scopus 로고
    • Point and interval estimation for a simple step-stress model with Type-II censoring
    • N. Balakrishnan D. Kundu H.K.T. Ng N. Kannan 2007 Point and interval estimation for a simple step-stress model with Type-II censoring Journal of Quality Technology 39 35 47
    • (2007) Journal of Quality Technology , vol.39 , pp. 35-47
    • Balakrishnan, N.1    Kundu, D.2    Ng, H.K.T.3    Kannan, N.4
  • 5
    • 0024891878 scopus 로고
    • Optimum simple step-stress accelerated life test with censoring
    • D.S. Bai M.S. Kim S.H. Lee 1989 Optimum simple step-stress accelerated life test with censoring IEEE Transactions on Reliability 38 528 532
    • (1989) IEEE Transactions on Reliability , vol.38 , pp. 528-532
    • Bai, D.S.1    Kim, M.S.2    Lee, S.H.3
  • 10
    • 0000714520 scopus 로고
    • Bayesian estimation and optimal design in partially accelerated life testing
    • M.H. DeGroot P.K. Goel 1979 Bayesian estimation and optimal design in partially accelerated life testing Naval Research Logistics Quarterly 26 223 235
    • (1979) Naval Research Logistics Quarterly , vol.26 , pp. 223-235
    • Degroot, M.H.1    Goel, P.K.2
  • 18
    • 84896838005 scopus 로고
    • Multiple step-stress accelerated life test: The tampered failure rate model
    • M.T. Madi 1993 Multiple step-stress accelerated life test: the tampered failure rate model Communications in Statistics-Theory and Methods 22 2631 2639
    • (1993) Communications in Statistics-Theory and Methods , vol.22 , pp. 2631-2639
    • Madi, M.T.1
  • 20
    • 0020734526 scopus 로고
    • Optimum simple step-stress plans for accelerated life testing
    • R. Miller W.B. Nelson 1983 Optimum simple step-stress plans for accelerated life testing IEEE Transactions on Reliability 32 59 65
    • (1983) IEEE Transactions on Reliability , vol.32 , pp. 59-65
    • Miller, R.1    Nelson, W.B.2
  • 21
    • 0019026625 scopus 로고
    • Accelerated life testing: Step-stress models and data analyis
    • W. Nelson 1980 Accelerated life testing: step-stress models and data analyis IEEE Transactions on Reliability 29 103 108
    • (1980) IEEE Transactions on Reliability , vol.29 , pp. 103-108
    • Nelson, W.1
  • 23
    • 0003116575 scopus 로고
    • On one physical priciple in reliability theory (in Russian)
    • N.M. Sedyakin 1966 On one physical priciple in reliability theory (in Russian) Techn. Cybernetics 3 80 87
    • (1966) Techn. Cybernetics , vol.3 , pp. 80-87
    • Sedyakin, N.M.1
  • 24
    • 0035265698 scopus 로고    scopus 로고
    • Commentary: Inference in simple step-stress models
    • A.J. Watkins 2001 Commentary: inference in simple step-stress models IEEE Transactions on Reliability 50 36 37
    • (2001) IEEE Transactions on Reliability , vol.50 , pp. 36-37
    • Watkins, A.J.1
  • 25
    • 0032083911 scopus 로고    scopus 로고
    • Inference on a simple step-stress model with Type-II censored exponential data
    • C. Xiong 1998 Inference on a simple step-stress model with Type-II censored exponential data IEEE Transactions on Reliability 47 142 146
    • (1998) IEEE Transactions on Reliability , vol.47 , pp. 142-146
    • Xiong, C.1
  • 26
    • 0032684450 scopus 로고    scopus 로고
    • Step-stress life-testing with random stress change times for exponential data
    • C. Xiong G.A. Milliken 1999 Step-stress life-testing with random stress change times for exponential data IEEE Transactions on Reliability 48 141 148
    • (1999) IEEE Transactions on Reliability , vol.48 , pp. 141-148
    • Xiong, C.1    Milliken, G.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.