Optimum step-stress accelerated life test Plans for log-location-scale distributions

Naval Research Logistics

Volumn 55, Issue 6, 2008, Pages 551-562

  Ma, Haiming ^a   Meeker, William Q ^a  

^a E005A Lagomarcino Hall   (United States)

Author keywords

Cumulative exposure model; Large sample approximate variance; Maximum likelihood

Indexed keywords

CUMULATIVE EXPOSURE MODEL; LARGE-SAMPLE APPROXIMATE VARIANCE; MAXIMUM LIKELIHOOD; STEP-STRESS;

ARSENIC COMPOUNDS; IMAGE SEGMENTATION; QUALITY ASSURANCE; RELIABILITY; RELIABILITY THEORY; STRESS ANALYSIS;

TESTING;

EID: 51349097311     PISSN: 0894069X     EISSN: 15206750     Source Type: Journal    
DOI: 10.1002/nav.20299     Document Type: Article

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