A new model for step-stress testing

IEEE Transactions on Reliability

Volumn 47, Issue 2, 1998, Pages 131-134

  Khamis, Imad H ^a   Higgins, James J ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

Accelerated life testing; Cumulative exposure model; Exponential distribution; Weibull distribution

Indexed keywords

MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PARAMETER ESTIMATION; RELIABILITY; SERVICE LIFE; STATISTICAL METHODS; WEIBULL DISTRIBUTION;

ACCELERATED LIFE TESTING; STEP-STRESS TESTING; WEIBULL CUMULATIVE EXPOSURE MODEL (CE-M);

STRESS ANALYSIS;

EID: 0032083940     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.722275     Document Type: Article

References (8)

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4. I.H. Khamis, J.J. Higgins, "An alternative to the Weibull cumulative exposure model", 1996 Proc. Section on Quality & Productivity, American Statistical Association. 1996 Aug; Chicago.
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6. R. Miller, W.B. Nelson, "Optimum simple step-stress plans for accelerated life testing", IEEE Trans. Reliability, vol R-32, 1983 Apr, pp 59-65.
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8. W.B. Nelson, Accelerated Testing, Statistical Models, Test Plans and Data Analysis. 1990; John Wiley & Sons.