Step-stress accelerated life tests: A proportional hazards-based non-parametric model

IIE Transactions (Institute of Industrial Engineers)

Volumn 44, Issue 9, 2012, Pages 754-764

  Hu, Cheng Hung ^a   Plante, Robert D ^a   Tang, Jen ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

accelerated life test; cumulative exposure; goodness of fit test; Lifetime distribution; non parametric approach; optimal design; proportional hazards model; step stress tests

Indexed keywords

ACCELERATED LIFE TESTS; CUMULATIVE EXPOSURES; GOODNESS-OF-FIT TEST; LIFE-TIME DISTRIBUTION; NONPARAMETRIC APPROACHES; OPTIMAL DESIGN; PROPORTIONAL HAZARDS MODEL; STEP-STRESS;

STATISTICAL TESTS;

HAZARDS;

EID: 84862907385     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/0740817X.2011.596508     Document Type: Article

References (33)

1. Alhadeed, A.A. and Yang, S.S. (2005) Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE Transaction on Reliability, 54, 64-68.
2. Bai, D.S. and Chun, Y.R. (1991) Optimum simple step-stress accelerated life-tests with competing causes of failure. IEEE Transaction on Reliability, 40, 622-627.
3. Bai, D.S. and Kim, M. S. (1993) Optimum simple step-stress accelerated life tests for Weibull distribution and type I censoring. Naval Research Logistics, 40, 193-210.
4. Balakrishnan, N., Beutner, E. and Kateri, M. (2009) Order restricted inference for exponential step-stress models. IEEE Transactions on Reliability, 58(1), 132-142.
5. Balakrishnan, N. and Han, D. (2008) Exact inference for a simple stepstress model with competing risks for failure from exponential distribution under type-II censoring. Journal of Statistical Planning and Inference, 138, 4172-4186.
6. Balakrishnan, N., Zhang, L. and Xie, Q. (2009) Inference for a simple step-stress model with type-I censoring and lognormally distributed lifetimes. Communications in Statistics -Theory and Methods, 38, 1690-1709.
7. Elsayed, E.A. andZhang,H. (2005) Design of optimumsimple step-stress accelerated life testing plans, presented at the 2005 International Workshop on Recent Advances in Stochastic Operations Research, Canmore, Canada.
8. Gouno, E. (2007) Optimum step-stress for temperature accelerated life testing. Quality and Reliability Engineering International, 23, 915-924.
9. Han, D. and Balakrishnan, N. (2010) Inference for a simple step-stress model with competing risks for failure from the exponential distribution under time constraint. Computational Statistics and Data Analysis, 54, 2066-2081.
10. Ismail, A.A. andAly,H.M. (2009) Optimal planning of failure-step stress partially accelerated life tests under type-II censoring. International Journal of Mathematical Analysis, 31, 1509-1523.
11. Kalbfleisch, J.D. and Prentice, R.L. (1980) The Statistical Analysis of Failure Time Data, Wiley, New York, NY.
12. Khamis, I.H. (1997) Comparison between constant and step-stress tests for Weibull models. International Journal of Quality and Reliability Management, 14, 74-81.
13. Lee, J. and Pan, R. (2010) Analyzing step-stress accelerated life testing data using generalized linear models. IIE Transactions, 42, 589-598.
14. Lu, M. W., Leiman, J.E., Rudy, R.J. and Lee, Y.L. (2006) Step-stress accelerated test. International Journal of Materials and Product Technology, 25, 231-239.
15. Ma,H. and Meeker,W.Q. (2008) Optimum step-stress accelerated life test plans for log-location-scale distributions. Naval Research Logistics, 55, 551-562.
16. Meeker,W.Q. and Escobar, A.L. (1998) Statistical Methods forReliability Data, Wiley, New York, NY.
17. Miller, R. and Nelson, W. (1983) Optimum simple step-stress plans for accelerated life testing. IEEE Transaction on Reliability, 32, 59-65.
18. Nelson, W. (1980) Accelerated life testing-step stress models and data analyses. IEEE Transactions on Reliability, 29(2), 103-108.
19. Nelson, W.B. (1990) Accelerated Testing-Statistical Models, Test Plans, and Data Analyses, Wiley, New York, NY.
20. Nelson, W.B. (2005a) A bibliography of accelerated test plans. IEEE Transactions on Reliability, 54, 194-197.
21. Nelson, W.B. (2005b) A bibliography of accelerated test plans part II-references. IEEE Transactions on Reliability, 54, 370-373.
22. Pascual, F.G. and Montepiedra, G. (2003) Model-robust test plans with applications in accelerated life testing. Technometrics, 45, 47-57.
23. Schmoyer, R.L. (1986) A distribution-free analysis for accelerated life testing at several levels of a single stress. Technometrics, 28, 165-175.
24. Schmoyer, R.L. (1988) Linear interpolation with a nonparametric accelerated failure time model. Journal of the American Statistical Association, 83, 441-449.
25. Schmoyer, R.L. (1991) Nonparametric analysis for two-level single-stress accelerated life tests. Technometrics, 33, 175-186.
26. Shaked, M. and Singpurwalla, N.D. (1983) Inference for step-stress accelerated life tests. Journal of Statistical Planning and Inference, 7, 295-306.
27. Srivastava, P.W. and Mittal, N. (2010) Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring. Applied Mathematical Modelling, 34, 3166-3178.
28. Tang, L.C., Sun, Y.S., Goh, T.N. and Ong, H.L. (1996) Analysis of stepstress accelerated-life-test data: A new approach. IEEE Transactions on Reliability, 45, 69-74.
29. Tang, L.C., Yang, G. Y. and Xie, M. (2004) Planning of step-stress accelerated degradation tests, in Proceedings of the Annual Reliability and Maintainability Symposium, pp. 287-292.
30. Tseng, S.T. and Wen, Z.C. (2000) Step-stress accelerated degradation analysis for highly reliable products. Journal of Quality Technology, 32, 209-216.
31. Tyoskin, O.I. andKrivolapov, S. Y. (1996) Nonparametric model for stepstress accelerated life testing. IEEE Transactions on Reliability, 45, 346-350.
32. Wang, B.X. (2010) Interval estimation for exponential progressive type-II censored step-stress accelerated life-testing. Journal of Statistical Planning and Inference, 140, 2706-2718.
33. Zhao, W. and Elsayed, E.A. (2005) A general accelerated life model for step-stress testing. IIE Transactions, 37, 1059-1069.