Estimation of nand flash memory threshold voltage distribution for optimum soft-decision error correction

IEEE Transactions on Signal Processing

Volumn 61, Issue 2, 2013, Pages 440-449

  Lee, Dong Hwan ^a   Sung, Wonyong ^a  

^a Seoul National University   (South Korea)

Author keywords

Gradient descent; Levenberg Marquardt; low density parity check (LDPC) code; NAND flash memory; parameter estimation; soft decision error correcting code (ECC)

Indexed keywords

ERROR CORRECTING CODE; GRADIENT DESCENT; LEVENBERG-MARQUARDT; LOW-DENSITY PARITY-CHECK CODES; NAND FLASH MEMORY;

ALGORITHMS; NAND CIRCUITS; PARAMETER ESTIMATION; THRESHOLD VOLTAGE; VOLTAGE DISTRIBUTION MEASUREMENT; VOLTAGE DIVIDERS;

ERROR CORRECTION;

EID: 84872024365     PISSN: 1053587X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSP.2012.2222399     Document Type: Article

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