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Volumn , Issue , 2011, Pages

Soft information for LDPC decoding in flash: Mutual-information optimized quantization

Author keywords

[No Author keywords available]

Indexed keywords

ALGEBRAIC CODES; AWGN CHANNEL; BCH CODE; BLOCK ERROR RATES; ERROR CORRECTION CODING; HIGH DENSITY; HIGH-CAPACITY; INPUT AND OUTPUTS; LDPC DECODER; LOW-DENSITY PARITY-CHECK CODES; MULTILEVEL CELL; MULTIPLE CELLS; MUTUAL INFORMATIONS; NAND FLASH MEMORY; REFERENCE VOLTAGES; SOFT INFORMATION; STORAGE CAPACITY;

EID: 84863127171     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/GLOCOM.2011.6134417     Document Type: Conference Paper
Times cited : (128)

References (17)
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  • 2
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    • DOI 10.1109/55.998871, PII S0741310602040405
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    • (2002) IEEE Electron Device Letters , vol.23 , Issue.5 , pp. 264-266
    • Lee, J.-D.1    Hur, S.-H.2    Choi, J.-D.3
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    • S. Li and T. Zhang. Improving Multi-Level NAND Flash Memory Storage Reliability Using Concatenated BCH-TCM Coding. IEEE Trans. VLSI Systems, 18(10):1412-1420, Oct. 2010.
    • (2010) IEEE Trans. VLSI Systems , vol.18 , Issue.10 , pp. 1412-1420
    • Li, S.1    Zhang, T.2
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    • Feb.
    • G. Dong, N. Xie, and T. Zhang. On the Use of Soft-Decision Error-Correcting Codes in NAND Flash Memory. IEEE Trans. Circ. and Sys., 58(2):429-439, Feb. 2011.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.