Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction

Ultramicroscopy

Volumn 125, Issue , 2013, Pages 49-58

  Zheng, C L ^a   Etheridge, J ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

Chromatic aberration; Coherent

Indexed keywords

3-DIMENSIONAL; CALIBRATION SPECIMENS; CHROMATIC ABERRATION; COHERENT; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); ELECTRON PROBE; ELECTRON WAVELENGTHS; INTENSITY DISTRIBUTION; LATTICE SPACING; OPERATING MODES; PRECISE MEASUREMENTS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMPLE METHOD; THERMAL FIELD EMISSIONS;

TRANSMISSION ELECTRON MICROSCOPY;

ABERRATIONS;

ARTICLE; CHROMATIC ABBERATION; CONVERGENT BEAM ELECTRON DIFFRACTION; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON PROBE MICROANALYSIS; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE QUALITY; IMAGING SYSTEM; INTERMETHOD COMPARISON; LIGHT INTENSITY; LIGHT RELATED PHENOMENA; MATHEMATICAL MODEL; SCANNING CONFOCAL ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SYSTEMATIC ERROR; THREE DIMENSIONAL IMAGING;

EID: 84871766447     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.10.002     Document Type: Article

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