Energy filtered scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 42-43

  Wang, P ^a   Behan, G ^a   Kirkland, A I ^a   Nellist, P D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949186018     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094069     Document Type: Article

References (7)

1. P. D. Nellist et al., Science 305, 1741 (2004).
2. P. D. Nellist et al., Applied Physics Letters 89, 124105 (2006).
3. S. P. Frigo, et al, Applied Physics Letters 81, 2112 (2002).
4. E. C. Cosgriff et al., Ultramicroscopy 108, 1558 (2008).
5. A. J. D'Alfonso et al., Ultramicroscopy 108, 1567 (2008).
6. Manuscript in preparation.
7. The authors would like to acknowledge the support of the Leverhulme Trust, JEOL UK, the EPSRC and the Department of Materials at the University of Oxford