Frequency dependence of alpha-particle induced soft error rates of flip-flops in 40-nm CMOS technology

IEEE Transactions on Nuclear Science

Volumn 59, Issue 6, 2012, Pages 2796-2802

  Jagannathan, S ^a   Loveless, T D ^a   Bhuva, B L ^a   Gaspard, N J ^a   Mahatme, N ^b   Assis, T ^a   Wen, S J ^b   Wong, R ^b   Massengill, L W ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b CISCO SYSTEMS   (United States)

Author keywords

Alpha particles; charge sharing; frequency effects; hardened flip flops; radiation hardened by design; RHBD; single event effects; single event transient (SET); single event upset (SEU); soft error rates (SER); soft error upset

Indexed keywords

CMOS INTEGRATED CIRCUITS; HARDENING; RADIATION EFFECTS; TRANSIENTS;

CHARGE SHARING; FREQUENCY EFFECT; HARDENED FLIP-FLOPS; RADIATION-HARDENED-BY-DESIGN; RHBD; SINGLE EVENT EFFECTS; SINGLE EVENT TRANSIENTS; SINGLE EVENT UPSETS; SOFT ERROR; SOFT ERROR RATE;

FLIP FLOP CIRCUITS;

EID: 84871399918     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2012.2223827     Document Type: Article

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