Alpha-SER modeling & simulation for sub-0.25μm CMOS technology

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1999, Pages 81-82

  Dai, Changhong ^a   Hakim, Nagib ^a   Hareland, Scott ^a   Maiz, Jose ^a   Lee, Shiuh Wuu ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ALPHA PARTICLES; COMPUTER SIMULATION; CRITICAL CURRENTS; INTEGRATED INJECTION LOGIC CIRCUITS; PIECEWISE LINEAR TECHNIQUES; RANDOM ACCESS STORAGE;

ALPHA SOFT ERROR RATE MODEL; CIRCUIT CRITICAL CHARGE; FAILURE IN TIME; FUNNELING CHARGE COLLECTION; LAWRENCE LIVERMORE NATIONAL LABORATORY; SOURCE FOLLOWER CIRCUIT;

CMOS INTEGRATED CIRCUITS;

EID: 0033281348     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)