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MRS Bulletin

Volumn 37, Issue 12, 2012, Pages 1214-1221

From atoms to grains: Transmission electron microscopy of graphene

(3) Huang, Pinshane Y a Meyer, Jannik C b Muller, David A a

a Cornell University (United States)

b UNIVERSITY OF VIENNA (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC ARRANGEMENT; ATOMIC ORDERING; DIRECT IMAGING; GRAPHENE GROWTH; LIQUID MEDIA; MECHANICAL AND ELECTRICAL PROPERTIES; ORDERS OF MAGNITUDE; SINGLE ATOMS; STACKING SEQUENCE; TRANSMISSION ELECTRON MICROSCOPY TEM; ULTRA-THIN;

ATOMS; ELECTRIC PROPERTIES; GRAIN BOUNDARIES; TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL;

GRAPHENE;

EID: 84870003018 PISSN: 08837694 EISSN: None Source Type: Journal
DOI: 10.1557/mrs.2012.183 Document Type: Review

Times cited : (11)

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