Single atom imaging and spectroscopy in nanostructured carbon materials

MRS Bulletin

Volumn 37, Issue 1, 2012, Pages 36-38

  Suenaga, Kazu ^a   Kobayashi, Haruka ^a   Koshino, Masanori ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

defects; electron energy loss spectroscopy (EELS); Nanoscale; scanning transmission electron microscopy (STEM)

Indexed keywords

ANALYTICAL TECHNIQUES; BEAM DAMAGE; CARBON ATOMS; CARBON BASED MATERIALS; ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS); METALLOFULLERENES; NANO SCALE; NANO-STRUCTURED; NANOSTRUCTURED CARBON MATERIALS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SINGLE ATOM SPECTROSCOPY; SINGLE ATOMS; SINGLE LAYER;

ATOMIC SPECTROSCOPY; ATOMS; DEFECTS; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; GRAPHENE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 84855826030     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2011.339     Document Type: Article

References (14)

1. K. Suenaga, M. Tencé, C. Mory, C. Colliex, H. Kato, T. Okazaki, H. Shinohara, K. Hirahara, S. Bandow, S. Iijima, Science 290, 2280 (2000).
2. K. Hirahara, K. Suenaga, S. Bandow, T. Okazaki, H. Kato, H. Shinohara, S. Iijima, Phys. Rev. Lett. 85, 5384 (2000).
3. M. Tencé, M. Quartuccio, C. Colliex, Ultramicroscopy 58, 42 (1995).
4. H. Sawada, T. Sasaki, F. Hosokawa, S. Yuasa, M. Terao, M. Kawazoe, T. Nakamichi, T. Kaneyama, Y. Kondo, K. Kimoto, K. Suenaga, J. Electron Microscopy 58, 341 (2009).
5. H. Sawada, T. Sasaki, F. Hosokawa, S. Yuasa, M. Terao, M. Kawazoe, T. Nakamichi, T. Kaneyama, Y. Kondo, K. Kimoto, K. Suenaga, Ultramicroscopy 110, 958 (2010).
6. T. Sasaki, H. Sawada, F. Hosokawa, Y. Kohno, T. Tomita, T. Kaneyama, Y. Kondo, K. Kimoto, Y. Sato, K. Suenaga, J. Electron Microscopy 59, S7 (2010).
7. K. Suenaga, Y. Sato, Z. Liu, H. Kataura, T. Okazaki, K. Kimoto, H. Sawada, T. Sasaki, K. Omoto, T. Tomita, T. Kaneyama, Y. Kondo, Nature Chem. 1, 415 (2010).
8. O. Krivanek, N. Dellby, M.F. Murfitt, M.F. Chisholm, T.J. Pennycook, K. Suenaga, V. Nicolosi, Ultramicroscopy 110, 935 (2010).
9. F. Banhart, Reports on Progress in Physics 62, 1181 (1999).
10. A. Gubbens, M. Barfels, C. Trevor, R. Twesten, P. Mooney, P. Thomas, N. Menon, B. Kraus, C. Mao, B. McGinn, Ultramicroscopy 110, 962 (2010).
11. K. Suenaga, Y. Iizumi, T. Okazaki, European Physical Journal Applied Physics 54, 33508 (2011).
12. C.O. Girit, J.C. Meyer, R. Erni, M.D. Rossell, C. Kisielowski, L. Yang, C-H. Park, M.F. Crommie, M.L. Cohen, S.G. Louie, A. Zettl, Science 323, 1705 (2009).
13. Y. Kobayashi, K. Fukui, T. Enoki, K. Kusakabe, Phys. Rev. B 73, 125415 (2006).
14. K. Suenaga, M. Koshino, Nature 468 1088 (2010).