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Volumn 9, Issue 1, 2009, Pages 102-106

Direct imaging of rotational stacking faults in few layer graphene

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATING VOLTAGES; BI LAYERS; DIRECT IMAGING; ELECTRONIC DEVICES; FILTERING IN THE FREQUENCY DOMAINS; GRAPHENE; GRAPHENE LATTICES; GRAPHENE SHEETS; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPIES; HRTEM IMAGES; INTRINSIC STRUCTURES; PACKING STRUCTURES; RELATIVE ORIENTATIONS;

EID: 61749085061     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl8025949     Document Type: Article
Times cited : (241)

References (19)
  • 7
    • 0001512458 scopus 로고    scopus 로고
    • Kobayashi, K. Phys. Reυ. B 1996, 53, 5311091.
    • Kobayashi, K. Phys. Reυ. B 1996, 53, 5311091.
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.