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Volumn 9, Issue 1, 2009, Pages 102-106
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Direct imaging of rotational stacking faults in few layer graphene
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Author keywords
[No Author keywords available]
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Indexed keywords
ACCELERATING VOLTAGES;
BI LAYERS;
DIRECT IMAGING;
ELECTRONIC DEVICES;
FILTERING IN THE FREQUENCY DOMAINS;
GRAPHENE;
GRAPHENE LATTICES;
GRAPHENE SHEETS;
HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPIES;
HRTEM IMAGES;
INTRINSIC STRUCTURES;
PACKING STRUCTURES;
RELATIVE ORIENTATIONS;
FOURIER TRANSFORMS;
GRAPHITE;
STACKING FAULTS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
GRAPHITE;
NANOMATERIAL;
ARTICLE;
CHEMISTRY;
COMPUTER ASSISTED DIAGNOSIS;
CONFORMATION;
CRYSTALLIZATION;
EVALUATION;
IMAGE ENHANCEMENT;
MACROMOLECULE;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
PARTICLE SIZE;
ROTATION;
SURFACE PROPERTY;
TRANSMISSION ELECTRON MICROSCOPY;
ULTRASTRUCTURE;
CRYSTALLIZATION;
GRAPHITE;
IMAGE ENHANCEMENT;
IMAGE INTERPRETATION, COMPUTER-ASSISTED;
MACROMOLECULAR SUBSTANCES;
MATERIALS TESTING;
MICROSCOPY, ELECTRON, TRANSMISSION;
MOLECULAR CONFORMATION;
NANOSTRUCTURES;
NANOTECHNOLOGY;
PARTICLE SIZE;
ROTATION;
SURFACE PROPERTIES;
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EID: 61749085061
PISSN: 15306984
EISSN: None
Source Type: Journal
DOI: 10.1021/nl8025949 Document Type: Article |
Times cited : (241)
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References (19)
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