Direct evidence for atomic defects in graphene layers

Nature

Volumn 430, Issue 7002, 2004, Pages 870-873

  Hashimoto, Ayako ^a   Suenaga, Kazu ^a   Gloter, Alexandre ^a,b   Urita, Koki ^a,c   Iijima, Sumio ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITÉ PARIS SUD   (France)

^c CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHITE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC DEFECTS; GRAPHENE LAYERS;

CARBON NANOTUBES;

CARBON; GRAPHITE; NANOPARTICLE;

NANOTECHNOLOGY;

ARTICLE; CHEMICAL STRUCTURE; CHIRALITY; IMAGING; PRIORITY JOURNAL; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 4344607594     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/nature02817     Document Type: Article

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