Direct imaging of a two-dimensional silica glass on graphene

Nano Letters

Volumn 12, Issue 2, 2012, Pages 1081-1086

  Huang, Pinshane Y ^a   Kurasch, Simon ^b   Srivastava, Anchal ^c,g   Skakalova, Viera ^c,d   Kotakoski, Jani ^d,e   Krasheninnikov, Arkady V ^e,f   Hovden, Robert ^a   Mao, Qingyun ^a   Meyer, Jannik C ^b,d   Smet, Jurgen ^c   Muller, David A ^a   Kaiser, Ute ^b  

^a Cornell University   (United States)

^b UNIVERSITY OF ULM   (Germany)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^d UNIVERSITY OF VIENNA   (Austria)

^e UNIVERSITY OF HELSINKI   (Finland)

^f AALTO UNIVERSITY   (Finland)

^g BANARAS HINDU UNIVERSITY   (India)

Author keywords

2D silica; graphene imaging substrates; SiO 2; transmission electron microscopy; two dimensional glass; Zachariasen's model

Indexed keywords

2D STRUCTURES; AB INITIO CALCULATIONS; ATOMIC SCALE; ATOMIC-RESOLUTION; BI-LAYER; CONTINUOUS RANDOM NETWORKS; COVALENT BONDING; DIRECT IMAGING; GRAPHENE DEVICES; HIGH RESOLUTION ANALYSIS; LONG RANGE ORDERS; LOW-DIMENSIONAL MATERIALS; NOVEL STRUCTURES; PAIR DISTRIBUTION FUNCTIONS; RING STATISTICS; SIO 2; TRANSMISSION ELECTRON; TWO-DIMENSIONAL GLASS; VAN DER WAALS INTERACTIONS;

ATOMS; ELECTRON SPECTROSCOPY; GLASS; GLASS BONDING; SILICA; SILICON COMPOUNDS; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL; VAN DER WAALS FORCES;

GRAPHENE;

GLASS; GRAPHITE; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CHEMISTRY; PARTICLE SIZE; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

GLASS; GRAPHITE; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, MOLECULAR; PARTICLE SIZE; SILICON DIOXIDE; SURFACE PROPERTIES;

EID: 84856962325     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl204423x     Document Type: Article

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