Graphene-based quantum Hall effect metrology

MRS Bulletin

Volumn 37, Issue 12, 2012, Pages 1255-1264

  Schopfer, Félicien ^a   Poirier, Wilfrid ^a  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENIC TECHNIQUES; ELECTRICAL STANDARDS; ELECTRON CHARGE; FABRICATION TECHNIQUE; JOSEPHSON EFFECT; PLANCK'S CONSTANTS; QUANTIZATION ACCURACY; QUANTUM RESISTANCE; RESISTANCE STANDARDS;

CHEMICAL VAPOR DEPOSITION; EPITAXIAL GROWTH; GRAPHENE; HELIUM; QUANTUM HALL EFFECT; QUANTUM THEORY; STANDARDS; UNITS OF MEASUREMENT;

HALL EFFECT DEVICES;

EID: 84870001859     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2012.199     Document Type: Article

References (48)

1. K.V. Klitzing, Phys. Rev. Lett. 45, 494 (1980)
2. W. Poirier, F. Schopfer, Eur. Phys. J. Spec. Top. 172, 207 (2009)
3. W. Poirier, A. Bounouh, K. Hayashi, H. Fhima, F. Piquemal, G. Genevès, J.P. André, J. Appl. Phys. 92, 2844 (2002)
4. F. Piquemal, B. Jeckelmann, Eur. Phys. J. Spec. Top. 172 (2009)
5. A. Eichenberger, G. Genevès, P. Gournay, Eur. Phys. J. Spec. Top. 172, 363 (2009)
6. W. Poirier, F. Schopfer, J. Guignard, O. Thevenot, P. Gournay, C. R. Acad. Sci. 5, 171 (2011)
7. A.A. Penin, Phys. Rev. B 81, 089902 (E) (2010)
8. A.A. Penin, Phys. Rev. B 79, 113303 (2009)
9. A.H.C. Neto, F. Guinea, N.M.R. Peres, K.S. Novoselov, A.K. Geim, Rev. Mod. Phys. 81, 109 (2009)
10. K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, M.I. Katsnelson, S.V.D.I.V. Grigorieva, A.A. Firsov, Nature 438, 197 (2005)
11. K.S. Novoselov, Z. Jiang, Y. Zhang, S.V. Morozov, H.L. Stormer, U. Zeitler, G.S.B.J.C. Maan, P. Kim, A.K. Geim, Science 315, 1379 (2007)
12. J. Nilsson, A.H. Castro Neto, F. Guinea, N.M.R. Peres, Phys. Rev. B 78, 045405 (2008)
13. E. McCann, V.I. Falko, Phys. Rev. Lett. 96, 086805 (2006)
14. W. Poirier, F. Schopfer, Nat. Nanotechnol. 5, 171 (2010)
15. A. Hartland, K. Jones, J.M. Williams, B.L. Gallagher, T. Galloway, Phys. Rev. Lett. 66, 969 (1991)
16. B. Jeckelmann, W. Fasel, B. Jeanneret, IEEE Trans. Instrum. Meas. 44, 269 (1995)
17. A.J.M. Giesbers, G. Rietveld, E. Houtzager, U. Zeitler, R. Yang, K.S. Novoselov, A.K. Geim, J.C. Maan, Appl. Phys. Lett. 93, 222109 (2008)
18. B. Jeckelmann, B. Jeanneret, D. Inglis, Phys. Rev. B 55, 13124 (1997)
19. B. Jeckelmann, A. Rufenacht, B. Jeanneret, F. Overney, A. von Campenhausen, G. Hein, IEEE Trans. Instrum. Meas. 50, 218 (2001)
20. J. Guignard, D. Leprat, D.C. Glattli, F. Schopfer, W. Poirier, Phys. Rev. B 85, 165420 (2012)
21. S.D. Sarma, S. Adam, E.H. Hwang, E. Rossi, Rev. Mod. Phys. 83, 407 (2011)
22. K. Kedchedzi, V.I. Falko, E. McCann, B.L. Altshuler, Phys. Rev. Lett. 98, 176806 (2007)
23. D.V. Mc Caughan, V.T. Murphy, J. Appl. Phys. 44, 2008 (1973)
24. C. Chaubet, F. Geniet, Phys. Rev. B 58, 13015 (1998)
25. M. Friedemann, K. Pierz, R. Stosch, F.J. Ahlers, Appl. Phys. Lett. 95, 102103 (2009)
26. M. Woszczyna, M. Friedemann, K. Pierz, T. Weimann, F.J. Ahlers, J. Appl. Phys. 110, 043712 (2011)
27. J.-M. Poumirol, W. Escoffier, A. Kumar, B. Raquet, M. Goiran, Phys. Rev. B 82, 121401 (R) (2010)
28. M. Woszczyna, M. Friedemann, M. Götz, E. Pesel, K. Pierz, T. Weimann, F.J. Ahlers, Appl. Phys. Lett. 100, 164106 (2012)
29. A. Tzalenchuk, S. Lara-Avila, A. Kalaboukhov, S. Paolillo, M.S. Syvajarvi, R. Yakimova, O. Kazakova, T.J.B.M. Janssen, V. Falko, S. Kubatkin, Nat. Nanotechnol. 5, 186 (2010)
30. S. Lara-Avila, K. Moth-Poulsen, R. Yakimova, T. Bjørnholm, V. Falko, A. Tzalenchuk, S. Kubatkin, Adv. Mater. 23, 878 (2011)
31. T.J.B.M. Janssen, A. Tzalenchuk, R. Yakimova, S. Kubatkin, S. Lara-Avila, S. Kopylov, V.I. Falko, Phys. Rev. B 83, 233402 (2011)
32. A.M.R. Baker, J.A. Alexander-Webber, T. Altebaeumer, R.J. Nicholas, Phys. Rev. B 85, 115403 (2012)
33. T.J.B.M. Janssen, N.E. Fletcher, R. Goebel, J.M. Williams, A. Tzalenchuk, R. Yakimova, S. Kubatkin, S. Lara-Avila, V.I. Falko, New J. Phys. 13, 093026 (2011).
34. T.J.B.M. Janssen, J.M. Williams, N.E. Fletcher, R. Goebel, A. Tzalenchuk, R. Yakimova, S. Lara-Avila, S. Kubatkin, V.I. Falko, Metrologia 49, 294 (2012)
35. T. Shen, W. Wu, Q. Yu, C.A. Richter, R. Elmquist, D. Newell, Y.P. Chen, Appl. Phys. Lett. 99, 232110 (2011)
36. C. Berger, Z. Song, T. Li, X. Li, A.Y. Ogbazghi, R. Feng, Z. Dai, A.N. Marchenkov, E.H. Conrad, P.N. First, W.A. de Heer, J. Phys. Chem. B 108, 19912 (2004)
37. X. Li, W. Cai, J. An, S. Kim, J. Nah, D. Yang, R. Piner, A. Velamakanni, I. Jung, E. Tutuc, S.K. Banerjee, L. Colombo, R.S. Ruoff, Science 324, 1312 (2009)
38. F. Delahaye, J. Appl. Phys. 73, 7914 (1993)
39. M. Woszczyna, M. Friedemann, T. Dziomba, Th. Weimann, F.J. Ahlers, Appl. Phys. Lett. 99, 022112 (2011)
40. X. Du, I. Skachko, F. Duerr, A. Luican, E.Y. Andrei, Nature 462, 192 (2009)
41. C.R. Dean, A.F. Young, I. Meric, C. Lee, L. Wang, S. Sorgenfrei, K. Watanabe, T. Taniguchi, P. Kim, K.L. Shepard, J. Hone, Nat. Nanotechnol. 5, 722 (2010)
42. D. Waldmann, J. Jobst, F. Speck, T. Seyller, M. Krieger, H.B. Weber, Nat. Mater. 10, 357 (2011)
43. B. Jouault, N. Camara, B. Jabakhanji, A. Caboni, C. Consejo, P. Godignon, D.K. Maude, J. Camassel, Appl. Phys. Lett. 100, 052102 (2012)
44. E. Pallecchi, M. Ridene, D. Kazazis, C. Mathieu, F. Schopfer, W. Poirier, D. Mailly, A. Ouerghi, Appl. Phys. Lett. 100, 253109 (2012)
45. C. Riedl, C. Coletti, T. Iwasaki, A.A. Zakharov, U. Starke, Phys. Rev. Lett. 103, 246804 (2010)
46. X. Wu, Y. Hu, M. Ruan, N.K. Madiomanana, J. Hankinson, M. Sprinkle, C. Berger, W.A. de Heer, Appl. Phys. Lett. 95, 223108 (2009)
47. S. Lara-Avila, A. Tzalenchuk, S. Kubatkin, R. Yakimova, T.J.B.M. Janssen, K. Cedergren, T. Bergsten, V. Falko, Phys. Rev. Lett. 107, 166602 (2011)
48. F. Schopfer, W. Poirier, J. Appl. Phys. 102, 054903 (2007).;