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European Physical Journal: Special Topics

Volumn 172, Issue 1, 2009, Pages 207-245

Resistance metrology based on the quantum Hall effect

(2) Poirier, W a Schopfer, F a

a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67650514308 PISSN: 19516355 EISSN: 19516401 Source Type: Journal
DOI: 10.1140/epjst/e2009-01051-5 Document Type: Review

Times cited : (66)

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