Optimization of QHE-devices for metrological applications

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 218-222

  Jeckelmann, Beat ^a   Rüfenacht, Alain ^a   Jeanneret, Blaise ^a   Overney, Frédéric ^a   Pierz, Klaus ^b   Von Campenhausen, Aurel ^b   Hein, Günter ^b  

^a Swiss Federal Office of Metrology   (Switzerland)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Electrical quantum standards; Integer quantum Hall effect; Two dimensional electron system

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; HALL EFFECT DEVICES; SEMICONDUCTOR QUANTUM WELLS; STANDARDS;

ELECTRICAL QUANTUM STANDARDS; INTEGER QUANTUM HALL EFFECT; QUANTUM HALL EFFECT DEVICES; TWO DIMENSIONAL ELECTRON SYSTEM;

HALL EFFECT;

EID: 0035303443     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918106     Document Type: Article

References (10)