Testing universality of the quantum Hall effect by means of the Wheatstone bridge

Journal of Applied Physics

Volumn 102, Issue 5, 2007, Pages

  Schopfer, F ^a   Poirier, W ^a  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS CURRENTS; COMPARATOR CIRCUITS; CRYOGENIC EQUIPMENT; ELECTRIC RESISTANCE; HALL EFFECT; MAGNETIC FIELD EFFECTS; QUANTUM THEORY;

CRYOGENIC CURRENT COMPARATORS; METROLOGICAL CHARACTERIZATIONS; QUANTUM HALL EFFECTS; QUANTUM RESISTANCES;

MICROPROCESSOR CHIPS;

EID: 34548629972     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2776371     Document Type: Article

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