Calibration of higher eigenmode spring constants of atomic force microscope cantilevers

Nanotechnology

Volumn 21, Issue 46, 2010, Pages

  Lozano, Jose R ^a   Kiracofe, Daniel ^b   Melcher, John ^b   Garcia, Ricardo ^a   Raman, Arvind ^b  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; CALIBRATION METHOD; DYNAMIC ATOMIC FORCE MICROSCOPY; EIGEN MODES; EXPERIMENTAL MEASUREMENTS; PRIORI KNOWLEDGE; SPRING CONSTANTS; THEORETICAL RESULT; THERMAL VIBRATION;

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS;

CALIBRATION;

EID: 78650098712     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/46/465502     Document Type: Article

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