Distortion in the thermal noise spectrum and quality factor of nanomechanical devices due to finite frequency resolution with applications to the atomic force microscope

Review of Scientific Instruments

Volumn 82, Issue 9, 2011, Pages

  Sader, John E ^a   Sanelli, Julian ^a   Hughes, Barry D ^a   Monty, Jason P ^a   Bieske, Evan J ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL FORMULAS; ATOMIC FORCE MICROSCOPE CANTILEVERS; ATOMIC FORCE MICROSCOPES; DEVICE QUALITY FACTOR; EXPERIMENTAL INVESTIGATIONS; FINITE FREQUENCIES; FINITE SAMPLING; FINITE TIME; FOURIER; HIGH QUALITY FACTORS; LORENTZIAN DISTRIBUTIONS; LORENTZIAN SHAPES; MEASURED DATA; NANOMECHANICAL DEVICE; QUALITY FACTORS; SPECTRAL LEAKAGE; THERMAL-NOISE SPECTRUM;

ATOMIC FORCE MICROSCOPY; BROWNIAN MOVEMENT; ENERGY DISSIPATION; EQUIPMENT; FOURIER SERIES; MECHANICAL PROPERTIES; THERMAL NOISE; TIME SERIES;

ATOMIC SPECTROSCOPY;

EID: 80053539542     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3632122     Document Type: Article

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