Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope

Review of Scientific Instruments

Volumn 83, Issue 5, 2012, Pages

  Sader, John E ^a   Hughes, Barry D ^a   Sanelli, Julian A ^a   Bieske, Evan J ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL FORMULAS; ATOMIC FORCE MICROSCOPE (AFM); ATOMIC FORCE MICROSCOPE CANTILEVERS; BROWNIAN FLUCTUATIONS; CLOSED-FORM EXPRESSION; EFFECT OF MEASUREMENTS; EXPECTED VALUES; FINITE PROBABILITIES; FIT PARAMETERS; GAIN INSIGHT; LEAST SQUARE; LEAST SQUARES ANALYSIS; MEASUREMENT SCIENCE; MECHANISTIC PROPERTIES; MONTE CARLO SIMULATION; MULTIPLICATIVE NOISE; NANO-DEVICES; PRECISE MEASUREMENTS; QUALITY FACTORS; STANDARD DEVIATION; STATIONARY RANDOM SIGNAL; SYNTHETIC DATA; THEORETICAL FRAMEWORK;

ATOMIC FORCE MICROSCOPY; BROWNIAN MOVEMENT; MONTE CARLO METHODS; NATURAL FREQUENCIES; PARAMETER ESTIMATION; POWER SPECTRAL DENSITY; SPECTRAL DENSITY; UNCERTAINTY ANALYSIS;

PHASE NOISE;

EID: 84862133219     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4709496     Document Type: Review

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