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Volumn 83, Issue 9, 2012, Pages

Sensitivity maximized near-field scanning optical microscope with dithering sample stage

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK MECHANISMS; FIBER PROBE; GAP CONTROL; GRAPHENE SHEETS; HIGH Q FACTOR; HIGH SENSITIVITY; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; Q-FACTORS; SHEAR FORCE; TUNING FORKS; VERTICAL RESOLUTION;

EID: 84867010769     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4754290     Document Type: Review
Times cited : (3)

References (43)
  • 9
  • 16
    • 51349163515 scopus 로고    scopus 로고
    • 10.1088/0957-4484/19/38/384012
    • C. Höppener and L. Novotny, Nanotechnology 19, 384012 (2008). 10.1088/0957-4484/19/38/384012
    • (2008) Nanotechnology , vol.19 , pp. 384012
    • Höppener, C.1    Novotny, L.2
  • 41
    • 0025011056 scopus 로고
    • 10.1016/0092-8674(90)90299-T
    • J. G. Flanagan and P. Leder, Cell 5, 185 (1990). 10.1016/0092-8674(90) 90299-T
    • (1990) Cell , vol.5 , pp. 185
    • Flanagan, J.G.1    Leder, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.