High-resolution near-field optical investigation of crystalline domains in oligomeric PQT-12 thin films

Advanced Functional Materials

Volumn 21, Issue 5, 2011, Pages 860-868

  Kuehn, Sergei ^a   Pingel, Patrick ^b   Breusing, Markus ^a   Fischer, Thomas ^c   Stumpe, Joachim ^c   Neher, Dieter ^b   Elsaesser, Thomas ^a  

^a MAX BORN INSTITUT   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

^c FRAUNHOFER INSTITUTE FOR APPLIED POLYMER RESEARCH   (Germany)

Author keywords

Conjugated polymers; Near field spectroscopy; Organic semiconductors; Structure property relationships; Thin films. Characterization tools

Indexed keywords

CRYSTALLINE DOMAINS; CRYSTALLINE ORDER; CRYSTALLINE THIN FILMS; DICHROIC AREA; DIFFERENT LENGTH SCALE; DOMAIN BOUNDARY; DOMAIN STRUCTURE; ELECTRICAL AND OPTICAL PROPERTIES; HIERARCHICAL ORDER; HIGH FIELD; HIGH RESOLUTION; IN-PLANE ORIENTATION; MICROMETER-SCALE; NEAR-FIELD; NEAR-FIELD SPECTROSCOPY; NEEDLE-LIKE; OPTICAL INVESTIGATION; ORGANIC SEMICONDUCTOR THIN FILMS; ORGANIC SEMICONDUCTORS; POLARIZED LIGHT MICROSCOPY; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SPATIAL RESOLUTION; SPECTROSCOPIC METHOD; STRUCTURE AND MORPHOLOGY; STRUCTURE PROPERTY RELATIONSHIPS;

CONJUGATED POLYMERS; CRYSTALLINE MATERIALS; ELECTRIC PROPERTIES; LIGHT POLARIZATION; MOLECULAR ORIENTATION; OLIGOMERS; OPTICAL PROPERTIES; ORGANIC POLYMERS; SEMICONDUCTING ORGANIC COMPOUNDS; SPECTROSCOPIC ANALYSIS; THIN FILMS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 79952157075     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201001978     Document Type: Article

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