Enhancement of shear-force sensitivity using asymmetric response of tuning forks for near-field scanning optical microscopy

Optics Express

Volumn 12, Issue 19, 2004, Pages 4467-4475

  Yoo, Jang Hoon ^a   Lee, Jae Hoon ^a   Yim, Sang Youp ^a   Park, Seung Han ^a   Ro, Myong Do ^b   Kim, Joo Ho ^b   Park, In Sik ^b   Cho, Kyuman ^c  

^a Yonsei University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

^c Sogang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OSCILLATIONS; PIEZOELECTRIC TRANSDUCERS; PROBLEM SOLVING; RESONANCE; SURFACE MEASUREMENT; SURFACE ROUGHNESS;

HARMONIC OSCILLATOR; PINNING DOWN EFFECT; SCANNING MICROSCOPES; TUNING FORKS;

TUNING;

EID: 6344276753     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.004467     Document Type: Article

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