Full mapping of optical noise in photonic devices: An evaluation by near-field scanning microscopy

Optics Express

Volumn 16, Issue 13, 2008, Pages 9513-9518

  Moison, Jean Marie ^a   Abram, Izo ^a   Bensoussan, Marcel ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MAPPING; NOISE POLLUTION; PHOTONIC DEVICES; SAMPLING;

DEVICE DESIGN; LOW-FREQUENCY NOISE; MODE INSTABILITIES; MULTIPLE SAMPLING; NEAR-FIELD SCANNING MICROSCOPY; NOISE MAPPING; RELATIVE PHASE; TRANSVERSE MODE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ARTICLE; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; METHODOLOGY; OPTICS; PHOTON; RADIATION SCATTERING; SCANNING ELECTRON MICROSCOPY; THEORETICAL MODEL;

COMPUTER SIMULATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHT; MICROSCOPY, ELECTRON, SCANNING; MODELS, THEORETICAL; OPTICS; PHOTONS; SCATTERING, RADIATION;

EID: 46149109287     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.009513     Document Type: Article

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