Artifact reduction by intrinsic harmonics of tuning fork probe for scanning near-field optical microscopy

Optics Express

Volumn 18, Issue 21, 2010, Pages 22047-22060

  Dong, Zhaogang ^a,b   Zhang, Ying ^a   Kok, Shaw Wei ^a   Ng, Boon Ping ^a   Soh, Yeng Chai ^b  

^a SINGAPORE INSTITUTE OF MANUFACTURING TECHNOLOGY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC ANALYSIS; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; PROBES;

ARTIFACT REDUCTION; NORMAL CONDITION; OPTICAL SIGNALS; TOPOGRAPHICAL ARTIFACTS; TUNING FORKS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; ARTIFACT; CALIBRATION; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; OPTICS; OSCILLOMETRY; SCANNING PROBE MICROSCOPY; ULTRAVIOLET RADIATION;

ALGORITHMS; ARTIFACTS; CALIBRATION; EQUIPMENT DESIGN; MICROSCOPY; MICROSCOPY, SCANNING PROBE; MICROSCOPY, ULTRAVIOLET; OPTICS AND PHOTONICS; OSCILLOMETRY; ULTRAVIOLET RAYS;

EID: 78049519615     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.022047     Document Type: Article

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