Scanning ion conductance microscopy with distance-modulated shear force control

Nanotechnology

Volumn 18, Issue 14, 2007, Pages

  Böcker, Matthias ^a   Anczykowski, Boris ^a   Wegener, Joachim ^a   Schäffer, Tilman E ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CELLS; ELECTRIC CONDUCTANCE; FORCE CONTROL; IMAGE QUALITY; IONIC CONDUCTION; TOPOGRAPHY;

ION CURRENTS; MAMMALIAN CELLS; PIPETTE; SCANNING ION CONDUCTANCE MICROSCOPE (SICM); SHEAR FORCE CONTROL;

ION MICROSCOPES;

ELECTROLYTE;

ARTICLE; FORCE; IMAGE QUALITY; IMAGING SYSTEM; ION CONDUCTANCE; ION CURRENT; MECHANICAL PROBE; PIPETTE; PRIORITY JOURNAL; PROBABILITY; SCANNING ELECTRON MICROSCOPY; SHEAR STRESS;

EID: 33947151568     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/14/145505     Document Type: Article

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