Measuring near-field optical distributions emitted from chip surface of photonic crystal patterned light emitting diode

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6988, Issue , 2008, Pages

  Park, Kyoung Duck ^a   Ji, Won Soo ^b   Park, Dae Seo ^a   Kim, Dae Chan ^a   O, Beom Hoan ^a   Park, Se Geun ^a   Lee, El Hang ^a   Lee, Seung Gol ^a  

^a Inha University   (South Korea)

^b Samsung Electro Mechanics   (South Korea)

Author keywords

Light emitting diodes (LED); Light extraction efficiency; Multi quantum well (MQW); Near field distribution; Near field scanning optical microscopy (NSOM); Photonic crystal (PhC)

Indexed keywords

COMPUTER NETWORKS; CRYSTAL ATOMIC STRUCTURE; CRYSTALLOGRAPHY; FIBER OPTICS; GALLIUM ALLOYS; GALLIUM NITRIDE; IMAGING TECHNIQUES; LIGHT EMITTING DIODES; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; PHOTONIC CRYSTALS; PHOTONICS; PHYSICAL OPTICS; POWDERS; SCANNING; SEMICONDUCTING GALLIUM; SEMICONDUCTOR QUANTUM WELLS; SURFACE PROPERTIES; SURFACES;

(1 1 0) SURFACE; APPLIED (CO); BLUE LED; CHIP SURFACES; FIBER PROBES; LAYER STRUCTURES; LIGHT EMITTING; LOCK-IN AMPLIFIER (LIA); MULTI QUANTUM WELL (MQW); NANO-PHOTONICS; NEAR FIELDS; NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM); NOISE REDUCTIONS; OPTICAL (PET) (OPET); PHOTONIC; PHOTONIC CRYSTAL (PHC); SAPPHIRE SUBSTRATES; SHEAR FORCE FEEDBACK; TUNING FORK (TF);

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 45449094656     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.780816     Document Type: Conference Paper

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