Stochastic simulation of tip-sample interactions in atomic force microscopy

Applied Physics Letters

Volumn 101, Issue 11, 2012, Pages

  Labuda, Aleksander ^a   Lysy, Martin ^b   Grütter, Peter ^a  

^a MCGILL UNIVERSITY   (Canada)

^b HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; DATA INTERPRETATION; DISPLACEMENT NOISE; FORCE SPECTROSCOPY; GAIN INSIGHT; HYDRATION LAYERS; MECHANICAL NOISE; SEMI-EMPIRICAL; STOCHASTIC DYNAMICS; STOCHASTIC SIMULATIONS; TIP-SAMPLE INTERACTION;

DATA PROCESSING; DYNAMICS; MICA; NANOCANTILEVERS; POWER SPECTRAL DENSITY; STOCHASTIC MODELS;

ATOMIC FORCE MICROSCOPY;

EID: 84866310440     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4745781     Document Type: Article

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