Stochastic noise in atomic force microscopy

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 86, Issue 3, 2012, Pages

  Labuda, Aleksander ^a   Lysy, Martin ^b   Paul, William ^a   Miyahara, Yoichi ^a   Grütter, Peter ^a   Bennewitz, Roland ^c   Sutton, Mark ^a  

^a MCGILL UNIVERSITY   (Canada)

^b HARVARD UNIVERSITY   (United States)

^c INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CANTILEVER DEFLECTION; DETERMINISTIC SIGNALS; EXPERIMENTAL PROTOCOLS; INTERPRETATION OF DATA; LINEAR MEASUREMENTS; MEASUREMENT TECHNIQUES; MULTIPLE SLIPS; NOISE ANALYSIS; NOISE SOURCE; NONSTATIONARY; POWER SPECTRAL DENSITIES (PSD); SIGNAL TO NOISE; STANDARD DEVIATION; STATIONARY STOCHASTIC PROCESS; STATISTICAL PROPERTIES; STICK-SLIP PROCESS; STOCHASTIC BEHAVIOR; STOCHASTIC NOISE; TEMPERATURE DEPENDENCE; THERMODYNAMIC LIMITS; VELOCITY DEPENDENCE;

EXPERIMENTS; FRICTION; GAUSSIAN NOISE (ELECTRONIC); LIGHT SOURCES; NANOCANTILEVERS; POWER SPECTRAL DENSITY; RANDOM PROCESSES; SLIP FORMING; STOCHASTIC SYSTEMS; VIBRATIONS (MECHANICAL);

ATOMIC FORCE MICROSCOPY;

EID: 84866320167     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.86.031104     Document Type: Article

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