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Applied Physics Letters

Volumn 93, Issue 25, 2008, Pages

Atomic force microscopy cantilever dynamics in liquid in the presence of tip sample interaction

(3) De Beer, Sissi a Van Den Ende, Dirk a Mugele, Frieder a

a UNIVERSITY OF TWENTE (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; DYNAMICS; FLOW INTERACTIONS; GRAPHITE; NANOCANTILEVERS; OSCILLATORS (ELECTRONIC); OSCILLATORS (MECHANICAL);

AFM MEASUREMENTS; AND MODELING; ATOMIC FORCE MICROSCOPY CANTILEVERS; ATOMIC FORCES; DRIVING FORCES; DRIVING FREQUENCIES; HARMONIC OSCILLATORS; HIGHLY ORIENTED PYROLITIC GRAPHITES; PRONOUNCED SIGNATURES; SOLVATION FORCES; SUB NANOMETERS;

ATOMIC FORCE MICROSCOPY;

EID: 58149171626 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3050532 Document Type: Article

Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.