High-resolution friction force microscopy under electrochemical control

Review of Scientific Instruments

Volumn 81, Issue 8, 2010, Pages

  Labuda, Aleksander ^a   Paul, William ^a   Pietrobon, Brendan ^a   Lennox, R Bruce ^a   Grütter, Peter H ^a   Bennewitz, Roland ^a,b  

^a MCGILL UNIVERSITY   (Canada)

^b INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FRICTION; ATOMIC-SCALE FRICTION; AU(111) SURFACES; CONFINED LIQUIDS; DESIGN AND DEVELOPMENT; ELECTROCHEMICAL CONTROL; ELECTROCHEMICAL ENVIRONMENTS; EXPERIMENTAL REQUIREMENTS; FRICTION FORCE MICROSCOPE; FRICTION FORCE MICROSCOPY; HIGH RESOLUTION; NOISE SOURCE; NORMAL FORCES; OCTAMETHYLCYCLOTETRASILOXANE; PERCHLORIC ACIDS; STICK-SLIP; TIMING RESOLUTIONS;

ACOUSTIC NOISE; FRICTION; GOLD COATINGS; INORGANIC ACIDS; MONOLAYERS; SLIP FORMING; TRIBOLOGY;

ATOMS;

EID: 77956301591     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3470107     Document Type: Review

References (28)

1. C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. PRLTAO 0031-9007 59, 1942 (1987). 10.1103/PhysRevLett.59.1942
2. E. Riedo, F. Ĺvy, and H. Brune, Phys. Rev. Lett. PRLTAO 0031-9007 88, 185505 (2002). 10.1103/PhysRevLett.88.185505
3. M. Dienwiebel, G. S. Verhoeven, N. Pradeep, J. W. M. Frenken, J. A. Heimberg, and H. W. Zandbergen, Phys. Rev. Lett. PRLTAO 0031-9007 92, 126101 (2004). 10.1103/PhysRevLett.92.126101
4. M. Binggeli, R. Christoph, H. E. Hintermann, and O. Marti, Surf. Coat. Technol. SCTEEJ 0257-8972 62, 523 (1993). 10.1016/0257-8972(93)90294-X
5. M. Nielinger and H. Baltruschat, Phys. Chem. Chem. Phys. PPCPFQ 1463-9076 9, 3965 (2007). 10.1039/b706804b
6. F. Hausen, M. Nielinger, S. Ernst, and H. Baltruschat, Electrochim. Acta ELCAAV 0013-4686 53, 6058 (2008). 10.1016/j.electacta.2008.03.053
7. A. Socoliuc, R. Bennewitz, E. Gnecco, and E. Meyer, Phys. Rev. Lett. PRLTAO 0031-9007 92, 134301 (2004). 10.1103/PhysRevLett.92.134301
8. G. Meyer and N. M. Am, Appl. Phys. Lett. APPLAB 0003-6951 53, 1045 (1988). 10.1063/1.100061
9. T. E. Schäffer, J. P. Cleveland, F. Ohnesorge, D. A. Walters, and P. K. Hansma, J. Appl. Phys. JAPIAU 0021-8979 80, 3622 (1996). 10.1063/1.363308
10. J. B. Thompson, B. Drake, J. H. Kindt, J. Hoskins, and P. K. Hansma, Nanotechnology NNOTER 0957-4484 12, 394 (2001). 10.1088/0957-4484/12/3/331
11. Y. Golan, L. Margulis, and I. Rubinstein, Surf. Sci. SUSCAS 0039-6028 264, 312 (1992). 10.1016/0039-6028(92)90188-C
12. D. Sarid, Exploring Scanning Probe Microscopy with MATHEMATICA (Wiley, New York, 1997).
13. J. E. Sader, J. W. M. Chon, and P. Mulvaney, Rev. Sci. Instrum. RSINAK 0034-6748 70, 3967 (1999). 10.1063/1.1150021
14. C. P. Green, H. Lioe, J. P. Cleveland, R. Proksch, P. Mulvaney, and J. E. Sader, Rev. Sci. Instrum. RSINAK 0034-6748 75, 1988 (2004). 10.1063/1.1753100
15. S. Maier, Y. Sang, T. Filleter, M. Grant, R. Bennewitz, E. Gnecco, and E. Meyer, Phys. Rev. B PLRBAQ 0556-2805 72, 245418 (2005). 10.1103/PhysRevB.72. 245418
16. J. G. Graeme, Photodiode Amplifiers: Op Amp Solutions (McGraw-Hill, New York, 1995).
17. B. Bhushan, Springer Handbook of Nanotechnology, 2nd ed. (Springer, Berlin, 2005).
18. A. Schirmeisen, L. Jansen, and H. Fuchs, Phys. Rev. B PLRBAQ 0556-2805 71, 245403 (2005). 10.1103/PhysRevB.71.245403
19. M. A. Lantz, D. Wiesmann, and B. Gotsmann, Nat. Nanotechnol. NNAABX 1748-3387 4, 586 (2009). 10.1038/nnano.2009.199
20. R. Guerra, A. Vanossi, and M. Urbakh, Phys. Rev. E PLEEE8 1063-651X 78, 036110 (2008). 10.1103/PhysRevE.78.036110
21. M. A. Lantz, S. J. Oshea, A. C. F. Hoole, and M. E. Welland, Appl. Phys. Lett. APPLAB 0003-6951 70, 970 (1997). 10.1063/1.118476
22. J. E. Sader and C. P. Green, Rev. Sci. Instrum. RSINAK 0034-6748 75, 878 (2004). 10.1063/1.1667252
23. R. W. Carpick, D. F. Ogletree, and M. Salmeron, Appl. Phys. Lett. APPLAB 0003-6951 70, 1548 (1997). 10.1063/1.118639
24. A. Yurtsever, A. M. Gigler, E. Macias, and R. W. Stark, Appl. Phys. Lett. APPLAB 0003-6951 91, 253120 (2007). 10.1063/1.2826285
25. S. Y. Krylov and J. W. M. Frenken, New J. Phys. NJOPFM 1367-2630 9, 398 (2007). 10.1088/1367-2630/9/10/398
26. J. P. Cleveland, T. E. Schäffer, and P. K. Hansma, Phys. Rev. B PLRBAQ 0556-2805 52, R8692 (1995). 10.1103/PhysRevB.52.R8692
27. E. Herrero, L. J. Buller, and H. D. Abruna, Chem. Rev. (Washington, D.C.) CHREAY 0009-2665 101, 1897 (2001). 10.1021/cr9600363
28. J. Hotlos, O. M. Magnussen, and R. J. Behm, Surf. Sci. SUSCAS 0039-6028 335, 129 (1995). 10.1016/0039-6028(95)00566-8