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Review of Scientific Instruments

Volumn 82, Issue 1, 2011, Pages

Exploiting cantilever curvature for noise reduction in atomic force microscopy

(2) Labuda, Aleksander a Grtter, Peter H a

a MCGILL UNIVERSITY (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPE CANTILEVERS; DETECTION NOISE; FIRST ORDER; LOWER LIMITS; NOISE REDUCTIONS; OPTICAL BEAM DEFLECTION; ORDER OF MAGNITUDE; RADIUS OF CURVATURE;

GOLD COATINGS; NANOCANTILEVERS; OPTICAL PROPERTIES; PROTECTIVE COATINGS;

ATOMIC FORCE MICROSCOPY;

EID: 79551664907 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3503220 Document Type: Article

Times cited : (12)

References (17)

1
- 0039661802
- 10.1063/1.100425
- G. Meyer and N. M. Amer, Appl. Phys. Lett. 53, 1045 (1988). 10.1063/1.100425
- (1988) Appl. Phys. Lett. , vol.53 , pp. 1045
- Meyer, G.¹ Amer, N.M.²

2
- 36449002421
- 10.1063/1.352149
- C. A. J. Putman, B. G. De Grooth, N. F. Van Hulst, and J. Greve, J. Appl. Phys. 72, 6 (1992). 10.1063/1.352149
- (1992) J. Appl. Phys. , vol.72 , pp. 6
- Putman, C.A.J.¹ De Grooth, B.G.² Van Hulst, N.F.³ Greve, J.⁴

3
- 18744405727
- Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
- DOI 10.1063/1.1896938, 053704
- T. Fukuma, M. Kimura, K. Kobayashi, K. Matsushige, and H. Yamada, Rev. Sci. Instrum. 76, 053704 (2005). 10.1063/1.1896938 (Pubitemid 40666036)
- (2005) Review of Scientific Instruments , vol.76 , Issue.5 , pp. 1-8
- Fukuma, T.¹ Kimura, M.² Kobayashi, K.³ Matsushige, K.⁴ Yamada, H.⁵

4
- 0141774751
- 10.1063/1.368707
- T. E. Schaffer and P. K. Hansma, J. Appl. Phys. 84, 4661 (1998). 10.1063/1.368707
- (1998) J. Appl. Phys. , vol.84 , pp. 4661
- Schaffer, T.E.¹ Hansma, P.K.²

5
- 0031211296
- 10.1063/1.365941
- A. Garcia-Valenzuela, J. Appl. Phys. 82, 985 (1997). 10.1063/1.365941
- (1997) J. Appl. Phys. , vol.82 , pp. 985
- Garcia-Valenzuela, A.¹

6
- 84861432606
- Force spectroscopy with a large dynamic range using small cantilevers and an array detector
- DOI 10.1063/1.1450258
- T. E. Schaffer, J. Appl. Phys. 91, 4739 (2002). 10.1063/1.1450258 (Pubitemid 34435644)
- (2002) Journal of Applied Physics , vol.91 , Issue.7 , pp. 4739
- Schaffer, T.E.¹

7
- 33646386930
- 10.1063/1.2188867
- T. Fukuma and S. P. Jarvis, Rev. Sci. Instrum. 77, 043701 (2006). 10.1063/1.2188867
- (2006) Rev. Sci. Instrum. , vol.77 , pp. 043701
- Fukuma, T.¹ Jarvis, S.P.²

8
- 79551654480
- in, Applied Scanning Probe Methods V, edited by B. Bhushan, H. Fuchs, and S. Kawata (Springer, New York)
- T. E. Schffer, in Scanning Probe Microscopy Techniques, Applied Scanning Probe Methods V, edited by, B. Bhushan, H. Fuchs, and, S. Kawata, (Springer, New York, 2007), pp. 51-74.
- (2007) Scanning Probe Microscopy Techniques , pp. 51-74
- Schffer, T.E.¹

9
- 79551666666
- See supplementary material at E-RSINAK-82-001011 for supporting data
- See supplementary material at http://dx.doi.org/10.1063/1.3503220 E-RSINAK-82-001011 for supporting data.

10
- 0003632209
- (Wiley, New York)
- M. C. Teich and B. E. A. Saleh, Fundamentals of Photonics (Wiley, New York, 1991).
- (1991) Fundamentals of Photonics
- Teich, M.C.¹ Saleh, B.E.A.²

11
- 77956301591
- 10.1063/1.3470107
- A. Labuda, W. Paul, B. Pietrobon, R. B. Lennox, P. H. Grtter, and R. Bennewitz, Rev. Sci. Instrum. 81, 083701 (2010). 10.1063/1.3470107
- (2010) Rev. Sci. Instrum. , vol.81 , pp. 083701
- Labuda, A.¹ Paul, W.² Pietrobon, B.³ Lennox, R.B.⁴ Grtter, P.H.⁵ Bennewitz, R.⁶

12
- 21444433963
- Optimized detection of normal vibration modes of atomic force microscope cantilevers with the optical beam deflection method
- DOI 10.1063/1.1872202, 083524
- T. E. Schaffer and H. Fuchs, J. Appl. Phys. 97, 083524 (2005). 10.1063/1.1872202 (Pubitemid 40914198)
- (2005) Journal of Applied Physics , vol.97 , Issue.8 , pp. 1-8
- Schaffer, T.E.¹ Fuchs, H.²

13
- 4544257551
- 10.1088/0957-4484/15/9/039
- R. Proksch, T. E. Schffer, J. P. Cleveland, R. C. Callahan, and M. B. Viani, Nanotechnology 15, 1344 (2004). 10.1088/0957-4484/15/9/039
- (2004) Nanotechnology , vol.15 , pp. 1344
- Proksch, R.¹ Schffer, T.E.² Cleveland, J.P.³ Callahan, R.C.⁴ Viani, M.B.⁵

14
- 0001213386
- 10.1103/PhysRevB.52.R8692
- J. P. Cleveland, T. E. Schffer, and P. K. Hansma, Phys. Rev. B 52, R8692 (1995). 10.1103/PhysRevB.52.R8692
- (1995) Phys. Rev. B , vol.52 , pp. 8692
- Cleveland, J.P.¹ Schffer, T.E.² Hansma, P.K.³

15
- 65449172852
- 10.1063/1.3129013
- K. Kobayashi, H. Yamada, and K. Matsushige, Rev. Sci. Instrum. 80, 043708 (2009). 10.1063/1.3129013
- (2009) Rev. Sci. Instrum. , vol.80 , pp. 043708
- Kobayashi, K.¹ Yamada, H.² Matsushige, K.³

16
- 70349685255
- 10.1088/0957-4484/20/40/405705
- P. Paolino and L. Bellon, Nanotechnology 20, 405705 (2009). 10.1088/0957-4484/20/40/405705
- (2009) Nanotechnology , vol.20 , pp. 405705
- Paolino, P.¹ Bellon, L.²

17
- 18744404788
- Calculation of thermal noise in an atomic force microscope with a finite optical spot size
- DOI 10.1088/0957-4484/16/6/007, PII S0957448405919545
- T. E. Schaffer, Nanotechnology 16, 664 (2005). 10.1088/0957-4484/16/6/007 (Pubitemid 40666566)
- (2005) Nanotechnology , vol.16 , Issue.6 , pp. 664-670
- Schaffer, T.E.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.