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Volumn , Issue , 2012, Pages 71-101

Analytical Methods for the Characterization of Aryl Layers

Author keywords

Attenuated total reflection (ATR); Infrared spectroscopic ellipsometry (IRSE); IR spectroscopy; Raman spectroscopy; Rutherford backscattering; time of flight secondary ion mass spectroscopy (ToF SIMS), solid liquid interface, in situ characterization, nitrobenzene, methoxybenzene, interface oxidation, ultra thin film, functional thin film; X ray photoelectron spectroscopy; X ray standing waves

Indexed keywords


EID: 84866132538     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527650446.ch4     Document Type: Chapter
Times cited : (17)

References (100)
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    • (2007) Spectrosc. Eur., 19, 11-14
    • Hinrichs, K., and Eichhorn, K.-J. (2008) Spectrosc. Asia, 4, 6-10; and (2007) Spectrosc. Eur., 19, 11-14.
    • (2008) Spectrosc. Asia , vol.4 , pp. 6-10
    • Hinrichs, K.1    Eichhorn, K.-J.2
  • 9
    • 84882904739 scopus 로고    scopus 로고
    • (eds H.G. Tompkins and E.A. Irene), William Andrew publishing, Springer
    • Röseler, A. (2005) in Handbook of Ellipsometry (eds H.G. Tompkins and E.A. Irene), William Andrew publishing, Springer, pp. 763-798.
    • (2005) Handbook of Ellipsometry , pp. 763-798
    • Röseler, A.1
  • 33
  • 50
    • 85083150318 scopus 로고    scopus 로고
    • NIST X-ray Photoelectron Spectroscopy Database. NIST Standard Reference Database 20, Version 3.5 Data compiled and evaluated by Wagner, C. D. (accessed 7 March 2012).
    • Naumkin, A.V., Kraut-Vass, A., Allison, J.W., Powell, C.J., and Rumble, J.R., Jr. (2000) NIST X-ray Photoelectron Spectroscopy Database. NIST Standard Reference Database 20, Version 3.5 Data compiled and evaluated by Wagner, C. D., http://srdata.nist.gov/xps/ (accessed 7 March 2012).
    • (2000)
    • Naumkin, A.V.1    Kraut-Vass, A.2    Allison, J.W.3    Powell, C.J.4    Rumble Jr., J.R.5
  • 94
    • 85083124051 scopus 로고
    • (ed.) Marcel Dekker Inc., New York and Basel
    • Wu, S. (ed.) (1982) Polymer Interface and Adhesion, Marcel Dekker Inc., New York and Basel, p. 138.
    • (1982) Polymer Interface and Adhesion , pp. 138
    • Wu, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.